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Lattice relaxations around individual dopant atoms in SrTiO3

Journal Article · · Physical Review Materials
The local atomic structure around individual dopant atoms can directly influence the electronic properties of a doped material. Here, we use quantitative scanning transmission electron microscopy to study the local lattice relaxations around Sm dopant atoms in SrTiO3 thin films. These films have recently been shown to undergo successive ferroelectric and superconducting transitions when strained. We show that neighboring Ti-O columns move away from the columns that contain Sm dopants. The observed displacements are, however, more complex than a simple outward expansion of all four surrounding Ti-O columns. We discuss potential implications, especially for the ferroelectric transition observed in strained films.
Research Organization:
Susanne Stemmer (University of California, Santa Barbara); Univ. of California, Santa Barbara, CA (United States)
Sponsoring Organization:
National Science Foundation (NSF); USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division
Grant/Contract Number:
FG02-02ER45994
OSTI ID:
1593373
Alternate ID(s):
OSTI ID: 1594782
Journal Information:
Physical Review Materials, Journal Name: Physical Review Materials Journal Issue: 11 Vol. 3; ISSN PRMHAR; ISSN 2475-9953
Publisher:
American Physical Society (APS)Copyright Statement
Country of Publication:
United States
Language:
English

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