Simulation of charge readout with segmented tiles in nEXO

Journal Article · Tue Sep 24 00:00:00 EDT 2019 · Journal of Instrumentation

DOI:https://doi.org/10.1088/1748-0221/14/09/P09020· OSTI ID:1580230

Li, Z.; Cen, W. R.; Robinson, A.; Moore, D. C.; Wen, L. J.; Odian, A.; Kharusi, S. Al; Anton, G.; Arnquist, I. J.; Badhrees, I.; Barbeau, P. S.; Beck, D.; Belov, V.; Bhatta, T.; Brodsky, J. P.; Brown, E.; Brunner, T.; Caden, E.; Cao, G. F.; Cao, L. ; Chambers, C.; Chana, B.; Charlebois, S. A.; Chiu, M.; Cleveland, B.; Coon, M.; Craycraft, A.; Dalmasson, J.; Daniels, T.; Darroch, L.; Daugherty, S. J.; Croix, A. De St.; Mesrobian-Kabakian, A. Der; DeVoe, R.; Vacri, M. L. Di; Dilling, J.; Ding, Y. Y.; Dolinski, M. J.; Dragone, A.; Echevers, J.; Elbeltagi, M.; Fabris, L.; Fairbank, D.; Fairbank, W.; Farine, J.; Ferrara, S.; Feyzbakhsh, S.; Fontaine, R.; Fucarino, A.; Gallina, G.; Gautam, P.; Giacomini, G.; Goeldi, D.; Gornea, R.; Gratta, G.; Hansen, E. V.; Heffner, M.; Hoppe, E. W.; Hößl, J.; House, A.; Hughes, M.; Iverson, A.; Jamil, A.; Jewell, M. J.; Jiang, X. S.; Karelin, A.; Kaufman, L. J.; Kodroff, D.; Koffas, T.; Krücken, R.; Kuchenkov, A.; Kumar, K. S.; Lan, Y.; Larson, A.; Leach, K. G.; Lenardo, B. G.; Leonard, D. S.; Li, G.; Li, S.; Licciardi, C.; Lin, Y. H.; Lv, P.; MacLellan, R.; McElroy, T.; Medina-Peregrina, M.; Michel, T.; Mong, B.; Murray, K.; Nakarmi, P.; Natzke, C. R.; Newby, R. J.; Ning, Z.; Njoya, O.; Nolet, F.; Nusair, O.; Odgers, K.; Oriunno, M.; Orrell, J. L.; Ortega, G. S.; Ostrovskiy, I.; Overman, C. T.; Parent, S.; Piepke, A.; Pocar, A.; Pratte, J. -F.; Radeka, V.; Raguzin, E.; Rescia, S.; Retière, F.; Richman, M.; Rossignol, T.; Rowson, P. C.; Roy, N.; Runge, J.; Saldanha, R.; Sangiorgio, S.; VIII, K. Skarpaas; Soma, A. K.; St-Hilaire, G.; Stekhanov, V.; Stiegler, T.; Sun, X. L.; Tarka, M.; Todd, J.; Tolba, T.; Totev, T. I.; Tsang, R.; Tsang, T.; Vachon, F.; Veeraraghavan, V.; Viel, S.; Visser, G.; Vivo-Vilches, C.; Vuilleumier, J. -L.; Wagenpfeil, M.; Walent, M.; Wang, Q.; Ward, M.; Watkins, J.; Weber, M.; Wei, W.; Wichoski, U.; Wu, S. X.; Wu, W. H.; Wu, X.; Xia, Q.; Yang, H.; Yang, L.; Yen, Y. -R.; Zeldovich, O.; Zhao, J.; Zhou, Y.; Ziegler, T.

nEXO is a proposed experiment to search for the neutrino-less double beta decay (0νββ) of ¹³⁶Xe in a tonne-scale liquid xenon time projection chamber (TPC). The nEXO TPC will be equipped with charge collection tiles to form the anode. In this work, the charge reconstruction performance of this anode design is studied with a dedicated simulation package. A multi-variate method and a deep neural network are developed to distinguish simulated 0νββ signals from backgrounds arising from trace levels of natural radioactivity in the detector materials. These simulations indicate that the nEXO TPC with charge-collection tiles shows promising capability to discriminate the 0νββ signal from backgrounds. Furthermore, the estimated half-life sensitivity for 0νββ decay is improved by 20 32)% with the multi-variate (deep neural network) methods considered here, e sensitivity estimated in the nEXO pre-conceptual design report.

• Research Organization: Brookhaven National Laboratory (BNL), Upton, NY (United States); Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States); Leland Stanford Junior Univ., Redwood City, CA (United States); Univ. of Alabama, Tuscaloosa, AL (United States)
• Sponsoring Organization: USDOE Office of Science (SC), High Energy Physics (HEP); National Science Foundation (NSF); USDOE National Nuclear Security Administration (NNSA); USDOE Office of Science (SC), Nuclear Physics (NP); Natural Sciences and Engineering Research Council of Canada (NSERC); Canada Foundation for Innovation (CFI); Fonds de recherche du Québec – Nature et technologies (FRQNT); National Research Council Canada (NRC); McDonald Institute; Institute for Basic Science (IBS); Russian Foundation for Basic Research (RFBR); Chinese Academy of Sciences (CAS); National Natural Science Foundation of China (NSFC); USDOE Laboratory Directed Research and Development (LDRD) Program
• Contributing Organization: The nEXO collaboration; nEXO Collaboration
• Grant/Contract Number: SC0012704; AC52-07NA27344; SC0017970; FG02-01ER41166
• OSTI ID: 1580230
• Alternate ID(s): OSTI ID: 1658689; OSTI ID: 1660461; OSTI ID: 1831057
• Report Number(s): BNL-212465-2019-JAAM; LLNL-JRNL-788038; BNL-211967-2019-JAAM; TRN: US2102199
• Journal Information: Journal of Instrumentation, Vol. 14, Issue 09; ISSN 1748-0221
• Publisher: Institute of Physics (IOP)
• Country of Publication: United States
• Language: English

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