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Title: In situ environmentally-isolated wear tester

Patent ·
OSTI ID:1576255
;

The present invention relates to an in situ testing system, which includes a wear tester and an enclosure. The wear tester is configured to apply a normal load, by way of a tip, to a surface of the test sample. Use of an enclosure allows such wear testing to be conducted in a controlled environment.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
NA0003525
Assignee:
National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM)
Patent Number(s):
10,429,284
Application Number:
15/659,467
OSTI ID:
1576255
Resource Relation:
Patent File Date: 2017 Jul 25
Country of Publication:
United States
Language:
English

References (10)

Data collection method, substrate processing apparatus, and substrate processing system patent February 2009
Scanning probe microscope apparatus for use in a scanning electron patent October 1995
Apparatus and Methods for Affinity Capture Tandem Mass Spectrometry patent-application December 2002
Part-inspecting system patent July 2001
Vacuum Processing Device and Mass Analyzing Device patent-application January 2019
Pattern Inspection Method and Pattern Inspection Apparatus patent-application August 2014
Substrate Supporting Apparatus, Substrate Supporting Method, Semiconductor Manufacturing Apparatus and Storage Medium patent-application April 2009
Portable universal friction testing machine and method patent February 2002
Diamond-dispersed fiber-reinforced composite for superior friction and wear properties in extreme environments and method for fabricating the same patent February 2017
Sample holding mechanism and sample working/observing apparatus patent August 2009

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36 MATERIALS SCIENCE