Soft X-ray spectroscopy with transition-edge sensors at Stanford Synchrotron Radiation Lightsource beamline 10-1

Lee, Sang -Jun; Titus, Charles J.; Alonso Mori, Roberto; Baker, Michael L.; Bennett, Douglas A.; Cho, Hsiao -Mei; Doriese, William B.; Fowler, Joseph W.; Gaffney, Kelly J.; Gallo, Alessandro; Gard, Johnathon D.; Hilton, Gene C.; Jang, Hoyoung; Joe, Young Il; Kenney, Christopher J.; Knight, Jason; Kroll, Thomas; Lee, Jun -Sik; Li, Dale; Lu, Donghui; Marks, Ronald; Minitti, Michael P.; Morgan, Kelsey M.; Ogasawara, Hirohito; O’Neil, Galen C.; Reintsema, Carl D.; Schmidt, Daniel R.; Sokaras, Dimosthenis; Ullom, Joel N.; Weng, Tsu -Chien; Williams, Christopher; Young, Betty A.; Swetz, Daniel S.; Irwin, Kent D.; Nordlund, Dennis

doi:10.1063/1.5119155

Title: Soft X-ray spectroscopy with transition-edge sensors at Stanford Synchrotron Radiation Lightsource beamline 10-1

Journal Article · Tue Nov 05 00:00:00 EST 2019 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.5119155· OSTI ID:1575245

^[1];

^[2]; Alonso Mori, Roberto ^[1]; Baker, Michael L. ^[3];

^[4]; Cho, Hsiao -Mei ^[1];

^[4]; Fowler, Joseph W. ^[4]; Gaffney, Kelly J. ^[1]; Gallo, Alessandro ^[1];

^[4]; Hilton, Gene C. ^[4]; Jang, Hoyoung ^[5]; Joe, Young Il ^[4]; Kenney, Christopher J. ^[1]; Knight, Jason ^[1]; Kroll, Thomas ^[1]; Lee, Jun -Sik ^[1]; Li, Dale ^[1]; Lu, Donghui ^[1] more »

SLAC National Accelerator Lab., Menlo Park, CA (United States)
Stanford Univ., Stanford, CA (United States)
Stanford Univ., Stanford, CA (United States); The Univ. of Manchester (United Kingdom); The Univ. of Manchester at Harwell, Didcot (United Kingdom)
National Inst. of Standards and Technology, Boulder, CO (United States)
SLAC National Accelerator Lab., Menlo Park, CA (United States); Pohang Accelerator Lab., Gyeongbuk (South Korea)
SLAC National Accelerator Lab., Menlo Park, CA (United States); ShanghaiTech Univ., Shanghai (China)
Santa Clara Univ., Santa Clara, CA (United States)
SLAC National Accelerator Lab., Menlo Park, CA (United States); Stanford Univ., Stanford, CA (United States)

We present results obtained with a new soft X-ray spectrometer based on transition-edge sensors (TESs) composed of Mo/Cu bilayers coupled to bismuth absorbers. This spectrometer simultaneously provides excellent energy resolution, high detection efficiency, and broadband spectral coverage. The new spectrometer is optimized for incident X-ray energies below 2 keV. Each pixel serves as both a highly sensitive calorimeter and an X-ray absorber with near unity quantum efficiency. We have commissioned this 240-pixel TES spectrometer at the Stanford Synchrotron Radiation Lightsource beamline 10-1 (BL 10-1) and used it to probe the local electronic structure of sample materials with unprecedented sensitivity in the soft X-ray regime. As mounted, the TES spectrometer has a maximum detection solid angle of 2 × 10^–3 sr. The energy resolution of all pixels combined is 1.5 eV full width at half maximum at 500 eV. We describe the performance of the TES spectrometer in terms of its energy resolution and count-rate capability and demonstrate its utility as a high throughput detector for synchrotron-based X-ray spectroscopy. Here, the results from initial X-ray emission spectroscopy and resonant inelastic X-ray scattering experiments obtained with the spectrometer are presented.

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Research Organization:: SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: 100487; AC02-76SF00515

OSTI ID:: 1575245

Alternate ID(s):: OSTI ID: 1573117

Journal Information:: Review of Scientific Instruments, Vol. 90, Issue 11; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 32 works

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Cited By (2)

A transition-edge sensor-based x-ray spectrometer for the study of highly charged ions at the National Institute of Standards and Technology electron beam ion trap Szypryt, P.; O’Neil, G. C.; Takacs, E. Review of Scientific Instruments, Vol. 90, Issue 12 https://doi.org/10.1063/1.5116717	journal	December 2019
A Transition-edge Sensor-based X-ray Spectrometer for the Study of Highly Charged Ions at the National Institute of Standards and Technology Electron Beam Ion Trap Szypryt, P.; O'Neil, G. C.; Takacs, E. arXiv https://doi.org/10.48550/arxiv.2005.05483	text	January 2020

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