Electron Nanocrystallography of Complex Materials and Processes

Technical Report · Mon Jan 06 00:00:00 EST 2020

OSTI ID:1575183

Zuo, Jian-Min  ^[1]

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1. Univ. of Illinois at Urbana-Champaign, IL (United States)

The proposed work is to develop Scanning CBED (SCBED) for the study of multi element crystals, including multiple principal elements alloys or high entropy alloys and relaxor-ferroelectric crystals. SCBED works like scanning transmission electron microscopy (STEM) but records the whole CBED at each probe position. Since CBED is a highly sensitive electron diffraction technique, SCBED combines the full benefits of CBED and STEM. Specifically, the SCBED based approach enables a quantitative determination of local atomic and electronic structures. The proposed work is thus to take advantage of SCBED for the study of complex multi-element crystals. The results from SCBED are expected to complement the methods of electron energy loss spectroscopy (EELS) near edge fine structure for probing local bonds, and X-ray and neutron scattering using the total scattering approach for probing local structure. Under the DOE BES support, we have developed SCBED to determine the structure of high entropy alloys, and we have coupled the work with in-situ compression study of dislocation dynamics to uncover the fundamental mechanisms of crystal slip.

• Research Organization: Univ. of Illinois at Urbana-Champaign, IL (United States)
• Sponsoring Organization: USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division (MSE)
• DOE Contract Number: FG02-01ER45923
• OSTI ID: 1575183
• Report Number(s): DOE-BES-45923; 2172446504
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
Electron Diffraction
High Entropy Alloys
Ferroelectrics