The Hybrid X-Pinch as a Source of XUV Radiation

Romanova, Vera M.; Tilikin, Ivan N.; Shelkovenko, Tatiana A.; Mingaleev, Albert R.; Bolkhovitinov, Evgeniy A.; Rupasov, Alexandr A.; Ter-Oganesyan, Alexey E.; Pikuz, Sergey A.

doi:10.1109/TPS.2018.2870321

The Hybrid X-Pinch as a Source of XUV Radiation

Journal Article · Mon Oct 01 00:00:00 EDT 2018 · IEEE Transactions on Plasma Science

DOI:https://doi.org/10.1109/TPS.2018.2870321· OSTI ID:1574941

^[1]; Tilikin, Ivan N. ^[2]; Shelkovenko, Tatiana A. ^[2]; Mingaleev, Albert R. ^[2]; Bolkhovitinov, Evgeniy A. ^[2]; Rupasov, Alexandr A. ^[2]; Ter-Oganesyan, Alexey E. ^[2]; ^[2]

Russian Academy of Sciences (RAS), Moscow (Russian Federation); Lebedev/Cornell
Russian Academy of Sciences (RAS), Moscow (Russian Federation)

The first detailed study of hybrid X-pinch (HXP) radiation in the wavelength range 10–200 Å on the BIN pulser (270 kA, 100 ns rise time) is introduced here. X-pinch loads were made from Al, Mo, Ag, and W wires with 13–30 μm diameters. Time-integrated images were obtained using open pinholes with 100 μm aperture. Spatially resolved XUV spectra were recorded using a transmission grating spectrograph on UF-4 film and with Fuji TR image plates. Signals from calibrated photoconducting detectors enabled estimates of the absolute yield of radiation and demonstrated that Mo HXPs radiate about 100× more energy in UV radiation than in X-rays with energy above 1 keV.

Research Organization:: Cornell Univ., Ithaca, NY (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

DOE Contract Number:: NA0003764

OSTI ID:: 1574941

Journal Information:: IEEE Transactions on Plasma Science, Journal Name: IEEE Transactions on Plasma Science Journal Issue: 11 Vol. 46; ISSN 0093-3813

Publisher:: IEEE

Country of Publication:: United States

Language:: English

References (14)

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Hot spot (HS)
X-pinch
XUV
imaging plates (IPs)
soft X-ray (SXR)
transmission grating spectrograph (TGS)

The Hybrid X-Pinch as a Source of XUV Radiation

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