The dual advanced ion simultaneous implantation experiment (DAISIE) for testing plasma-facing materials

Jasica, Matthew J.; Kulcinski, Gerald L.; Santarius, John F.; Bonomo, Richard M.

doi:10.1063/1.5120040

The dual advanced ion simultaneous implantation experiment (DAISIE) for testing plasma-facing materials

Journal Article · Fri Oct 18 00:00:00 EDT 2019 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.5120040· OSTI ID:1574486

^[1]; ^[2]; ^[2]; Bonomo, Richard M. ^[2]

Sandia National Lab. (SNL-NM), Albuquerque, NM (United States); Univ. of Wisconsin, Madison, WI (United States)
Univ. of Wisconsin, Madison, WI (United States)

A novel dual ion beam experimental facility, the Dual Advanced Ion Simultaneous Implantation Experiment (DAISIE), has been constructed at the University of Wisconsin-Madison Inertial Electrostatic Confinement laboratory for implanting candidate plasma-facing components of multiple ion species. DAISIE is capable of implanting ions at energies from 10 kV to 50 kV, ion currents of 10 µA–950 µA, corresponding to steady-state ion fluxes of 1 × 10¹⁴ cm^–2 s^–1 to 1 × 10¹⁶ cm^–2 s^–1, incidence angles of 55°, and surface temperatures of at least 1100 °C. Improvements to the sample current and sample temperature measurement and control systems over those used in prior UW-IEC experiments have been made. Likewise, optical measurements of the spot size of the beam on samples in DAISIE are in agreement with existing measurements of the ion beam and spot size in previous UW-IEC experiments. Dual-beam operation has been validated with helium-deuterium ion implantations in tungsten surfaces.

View Accepted Manuscript (DOE)

Research Organization:: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

Grant/Contract Number:: AC04-94AL85000; NA0003525

OSTI ID:: 1574486

Report Number(s):: SAND--2019-12882J; 680694

Journal Information:: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 10 Vol. 90; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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