Blind Ptychographic Phase Retrieval via Convergent Alternating Direction Method of Multipliers

Chang, Huibin; Enfedaque, Pablo; Marchesini, Stefano

doi:10.1137/18m1188446

Blind Ptychographic Phase Retrieval via Convergent Alternating Direction Method of Multipliers

Journal Article · Mon Jan 21 23:00:00 EST 2019 · SIAM Journal on Imaging Sciences

DOI:https://doi.org/10.1137/18m1188446· OSTI ID:1563992

^[1]; Enfedaque, Pablo ^[2]; ^[2]

Tianjin Normal Univ., Tianjin (China)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)

Ptychography has risen as a reference X-ray imaging technique: it achieves resolutions of one billionth of a meter, macroscopic field of view, or the capability to retrieve chemical or magnetic contrast, among other features. A ptychographic reconstruction is normally formulated as a blind phase retrieval problem, where both the image (sample) and the probe (illumination) have to be recovered from phaseless measured data. In this article we address a nonlinear least squares model for the blind ptychography problem with constraints on the image and the probe by maximum likelihood estimation of the Poisson noise model. We formulate a variant model that incorporates the information of phaseless measurements of the probe to eliminate possible artifacts. Next, we propose a generalized alternating direction method of multipliers designed for the proposed nonconvex models with convergence guarantee under mild conditions, where their subproblems can be solved by fast el-ementwise operations. Numerically, the proposed algorithm outperforms state-of-the-art algorithms in both speed and image quality.

View Accepted Manuscript (DOE)

Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC02-05CH11231

OSTI ID:: 1563992

Journal Information:: SIAM Journal on Imaging Sciences, Journal Name: SIAM Journal on Imaging Sciences Journal Issue: 1 Vol. 12; ISSN 1936-4954

Publisher:: Society for Industrial and Applied MathematicsCopyright Statement

Country of Publication:: United States

Language:: English

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Advanced denoising for X-ray ptychography Chang, Huibin; Enfedaque, Pablo; Zhang, Jie Optics Express, Vol. 27, Issue 8 https://doi.org/10.1364/OE.27.010395	journal	January 2019
Convex optimization-based blind deconvolution for images taken with coherent illumination Doelman, Reinier; Verhaegen, Michel Journal of the Optical Society of America A, Vol. 36, Issue 4 https://doi.org/10.1364/josaa.36.000678	journal	January 2019
Photon-limited ptychography of 3D objects via Bayesian reconstruction Nikitin, Viktor; Aslan, Selin; Yao, Yudong OSA Continuum, Vol. 2, Issue 10 https://doi.org/10.1364/osac.2.002948	journal	January 2019
Advanced denoising for X-ray ptychography Chang, Huibin; Enfedaque, Pablo; Zhang, Jie Deutsches Elektronen-Synchrotron, DESY, Hamburg https://doi.org/10.3204/pubdb-2019-02182	text	January 2019

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