Electric-field noise from thermally activated fluctuators in a surface ion trap

Noel, Crystal; Berlin-Udi, Maya; Matthiesen, Clemens; Yu, Jessica; Zhou, Yi; Lordi, Vincenzo; Häffner, Hartmut

doi:10.1103/PhysRevA.99.063427

Electric-field noise from thermally activated fluctuators in a surface ion trap

Journal Article · Wed Jun 26 00:00:00 EDT 2019 · Physical Review A

DOI:https://doi.org/10.1103/PhysRevA.99.063427· OSTI ID:1561446

Noel, Crystal ^[1]; Berlin-Udi, Maya ^[1]; ^[1]; Yu, Jessica ^[1]; Zhou, Yi ^[1]; Lordi, Vincenzo ^[2]; Häffner, Hartmut ^[1]

Univ. of California, Berkeley, CA (United States)
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

We probe electric-field noise near the metal surface of an ion-trap chip in the temperature range from 295 to 530 K. We observe a nontrivial temperature dependence with the noise amplitude at 1 MHz frequency saturating around 500 K. Measurements of the noise spectrum reveal a 1/f^α≈1 dependence and a small decrease in α between low and high temperatures. This behavior can be explained by considering noise from a distribution of thermally activated two-level fluctuators with activation energies between 0.35 and 0.65 eV. Processes in this energy range may be relevant to understanding electric-field noise in ion traps; for example, defect motion in the solid state and surface adsorbate binding energies. Lastly, the study of these processes may aid in identification of the origin of excess electric-field noise in ion traps—a major source of ion motional decoherence limiting the performance of surface traps as quantum devices.

View Accepted Manuscript (DOE)

Research Organization:: Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)

Sponsoring Organization:: USDOE; USDOE National Nuclear Security Administration (NNSA)

Grant/Contract Number:: AC52-07NA27344

OSTI ID:: 1561446

Alternate ID(s):: OSTI ID: 1546283

Report Number(s):: LLNL-JRNL--759281; 947593

Journal Information:: Physical Review A, Journal Name: Physical Review A Journal Issue: 6 Vol. 99; ISSN PLRAAN; ISSN 2469-9926

Publisher:: American Physical Society (APS)Copyright Statement

Country of Publication:: United States

Language:: English

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