Magnetic properties of superparamagnetic, nanocrystalline cobalt ferrite thin films deposited at low temperature

Sangeneni, Neelima; Taddei, Keith M.; Bhat, Navakanta; Shivashankar, Sa

doi:10.1016/j.jmmm.2018.06.038

Title: Magnetic properties of superparamagnetic, nanocrystalline cobalt ferrite thin films deposited at low temperature

Journal Article · Thu Jun 14 00:00:00 EDT 2018 · Journal of Magnetism and Magnetic Materials

DOI:https://doi.org/10.1016/j.jmmm.2018.06.038· OSTI ID:1560488

Sangeneni, Neelima ^[1];

^[2]; Bhat, Navakanta ^[1]; Shivashankar, Sa ^[1]

Indian Inst. of Science, Bengaluru (India)
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Bulk cobalt ferrite, being a hard ferrite, shows high magnetization, high resistivity and high coercivity. If thin films of cobalt ferrite can be deposited at a low enough temperature and if its coercivity can be reduced, cobalt ferrite will make a very good candidate for use as a magnetic core of an integrated inductor in RF-CMOS ICs. Though polycrystalline and epitaxial thin films of cobalt ferrite have been made by various techniques, there are no reports of thin films of superparamagnetic cobalt ferrite. In this work, nanocrystalline cobalt ferrite thin films, which are superparamagnetic as deposited, have been prepared in the solution medium at ~190 °C, using microwave irradiation. The as-prepared films have a saturation magnetization (M_S) of 401 emu/cc and coercivity (H_C) of 19 Oe at room temperature for a crystallite size of 2 nm. The cobalt ferrite powder obtained as a by-product during the same process has M_S of 50 emu/g and H_C of 5 Oe at room temperature, making it superparamagnetic. The as-prepared films were annealed in air at 300 °C for 5 min and 10 min. Annealing for 10 min results in an increase in crystallite size to 36 nm, M_S increases from 401 emu/cc to 545 emu/cc, and H_C increases from 19 Oe to 860 Oe. In conclusion, the change in magnetic properties can be directly associated with change in the crystallite size and degree of crystallographic inversion, as determined by neutron diffraction and deduced from X-ray photoelectron spectroscopy.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1560488

Journal Information:: Journal of Magnetism and Magnetic Materials, Vol. 465, Issue C; ISSN 0304-8853

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 18 works

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