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Title: Foreword to special section on “Near Ambient and Synchrotron Surface Analysis (NAXPS)"

Abstract

In the special section of this issue of Surface and Interface Analysis, 3 groups present their breaking research in pushing the boundaries of vacuum-based techniques such as XPS and SIMS to near ambient pressures. We have invited the leading authors to describe the impact of their research and share their perspective.

Authors:
 [1];  [2];  [3]; ORCiD logo [4]
  1. University of New Mexico
  2. Oak Ridge National Laboratory
  3. Sincrotrone Trieste SCpA
  4. BATTELLE (PACIFIC NW LAB)
Publication Date:
Research Org.:
Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1557167
Report Number(s):
PNNL-SA-135364
DOE Contract Number:  
AC05-76RL01830
Resource Type:
Journal Article
Journal Name:
Surface and Interface Analysis
Additional Journal Information:
Journal Volume: 50; Journal Issue: 10
Country of Publication:
United States
Language:
English
Subject:
SIMS, SOA, air-liquid interface

Citation Formats

Artyushkova, Kateryna, Mullins, David R., Gregoratti, Luca, and Yu, Xiao-Ying. Foreword to special section on “Near Ambient and Synchrotron Surface Analysis (NAXPS)". United States: N. p., 2018. Web. doi:10.1002/sia.6383.
Artyushkova, Kateryna, Mullins, David R., Gregoratti, Luca, & Yu, Xiao-Ying. Foreword to special section on “Near Ambient and Synchrotron Surface Analysis (NAXPS)". United States. doi:10.1002/sia.6383.
Artyushkova, Kateryna, Mullins, David R., Gregoratti, Luca, and Yu, Xiao-Ying. Mon . "Foreword to special section on “Near Ambient and Synchrotron Surface Analysis (NAXPS)"". United States. doi:10.1002/sia.6383.
@article{osti_1557167,
title = {Foreword to special section on “Near Ambient and Synchrotron Surface Analysis (NAXPS)"},
author = {Artyushkova, Kateryna and Mullins, David R. and Gregoratti, Luca and Yu, Xiao-Ying},
abstractNote = {In the special section of this issue of Surface and Interface Analysis, 3 groups present their breaking research in pushing the boundaries of vacuum-based techniques such as XPS and SIMS to near ambient pressures. We have invited the leading authors to describe the impact of their research and share their perspective.},
doi = {10.1002/sia.6383},
journal = {Surface and Interface Analysis},
number = 10,
volume = 50,
place = {United States},
year = {2018},
month = {10}
}