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Title: Foreword to special section on “Near Ambient and Synchrotron Surface Analysis (NAXPS)"

Journal Article · · Surface and Interface Analysis
DOI:https://doi.org/10.1002/sia.6383· OSTI ID:1557167

In the special section of this issue of Surface and Interface Analysis, 3 groups present their breaking research in pushing the boundaries of vacuum-based techniques such as XPS and SIMS to near ambient pressures. We have invited the leading authors to describe the impact of their research and share their perspective.

Research Organization:
Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC05-76RL01830
OSTI ID:
1557167
Report Number(s):
PNNL-SA-135364
Journal Information:
Surface and Interface Analysis, Vol. 50, Issue 10
Country of Publication:
United States
Language:
English

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