Oxidation of rubrene, and implications for device stability

Ly, Jack T.; Lopez, Steven A.; Lin, Janice B.; Kim, Jae Joon; Lee, Hyunbok; Burnett, Edmund K.; Zhang, Lei; Aspuru-Guzik, Alán; Houk, K. N.; Briseno, Alejandro L.

doi:10.1039/c7tc05775j

Oxidation of rubrene, and implications for device stability

Journal Article · Mon Jan 01 04:00:00 EST 2018 · Journal of Materials Chemistry C

DOI:https://doi.org/10.1039/c7tc05775j· OSTI ID:1539973

Ly, Jack T. ^[1]; ^[2]; ^[2]; Kim, Jae Joon ^[3]; ^[3]; Burnett, Edmund K. ^[3]; ^[4]; Aspuru-Guzik, Alán ^[5]; ^[2]; ^[3]

Department of Polymer Science and Engineering; University of Massachusetts Amherst; Amherst; USA; DOE/OSTI
Department of Chemistry and Biochemistry; University of California; Los Angeles; Los Angeles; USA
Department of Polymer Science and Engineering; University of Massachusetts Amherst; Amherst; USA
Department of Polymer Science and Engineering; University of Massachusetts Amherst; Amherst; USA; College of Energy
Department of Chemistry and Chemical Biology; Harvard University; Cambridge; USA

In studying the formation and thermally activated cycloreversion of oxidized rubrene to pristine rubrene, we observed an irreversible, second stage oxidized product. Understanding the formation of the irreversible adduct will help one design more chemically robust rubrene derivatives.

Research Organization:: Harvard Univ., Cambridge, MA (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

DOE Contract Number:: SC0015959

OSTI ID:: 1539973

Journal Information:: Journal of Materials Chemistry C, Journal Name: Journal of Materials Chemistry C Journal Issue: 14 Vol. 6; ISSN JMCCCX; ISSN 2050-7526

Publisher:: Royal Society of Chemistry

Country of Publication:: United States

Language:: English

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