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Title: Using ZnO–Cr 2 O 3 –ZnO heterostructures to characterize polarization penetration depth through non-polar films

Abstract

The polarization of ZnO films on Cr 2O 3/ZnO shows that substrate polarization affects a non-polar material for <3 atomic layers.

Authors:
ORCiD logo [1]; ORCiD logo [1];  [2];  [2];  [2]; ORCiD logo [1]; ORCiD logo [1]
  1. Center for Research on Interface Structures and Phenomena (CRISP); Yale University; New Haven; USA; Department of Chemical and Environmental Engineering
  2. Center for Research on Interface Structures and Phenomena (CRISP); Yale University; New Haven; USA; Department of Mechanical Engineering and Materials Science
Publication Date:
Research Org.:
Yale Univ., New Haven, CT (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1539884
DOE Contract Number:  
SC0014414
Resource Type:
Journal Article
Journal Name:
Physical Chemistry Chemical Physics. PCCP (Print)
Additional Journal Information:
Journal Volume: 19; Journal Issue: 48; Journal ID: ISSN 1463-9076
Publisher:
Royal Society of Chemistry
Country of Publication:
United States
Language:
English
Subject:
Chemistry; Physics

Citation Formats

Zhu, Xiaodong, Jhang, Jin-Hao, Zhou, Chao, Dagdeviren, Omur E., Chen, Zheng, Schwarz, Udo D., and Altman, Eric I. Using ZnO–Cr 2 O 3 –ZnO heterostructures to characterize polarization penetration depth through non-polar films. United States: N. p., 2017. Web. doi:10.1039/c7cp06059a.
Zhu, Xiaodong, Jhang, Jin-Hao, Zhou, Chao, Dagdeviren, Omur E., Chen, Zheng, Schwarz, Udo D., & Altman, Eric I. Using ZnO–Cr 2 O 3 –ZnO heterostructures to characterize polarization penetration depth through non-polar films. United States. doi:10.1039/c7cp06059a.
Zhu, Xiaodong, Jhang, Jin-Hao, Zhou, Chao, Dagdeviren, Omur E., Chen, Zheng, Schwarz, Udo D., and Altman, Eric I. Sun . "Using ZnO–Cr 2 O 3 –ZnO heterostructures to characterize polarization penetration depth through non-polar films". United States. doi:10.1039/c7cp06059a.
@article{osti_1539884,
title = {Using ZnO–Cr 2 O 3 –ZnO heterostructures to characterize polarization penetration depth through non-polar films},
author = {Zhu, Xiaodong and Jhang, Jin-Hao and Zhou, Chao and Dagdeviren, Omur E. and Chen, Zheng and Schwarz, Udo D. and Altman, Eric I.},
abstractNote = {The polarization of ZnO films on Cr2O3/ZnO shows that substrate polarization affects a non-polar material for <3 atomic layers.},
doi = {10.1039/c7cp06059a},
journal = {Physical Chemistry Chemical Physics. PCCP (Print)},
issn = {1463-9076},
number = 48,
volume = 19,
place = {United States},
year = {2017},
month = {1}
}

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