Using ZnO–Cr 2 O 3 –ZnO heterostructures to characterize polarization penetration depth through non-polar films

Zhu, Xiaodong; Jhang, Jin-Hao; Zhou, Chao; Dagdeviren, Omur E.; Chen, Zheng; Schwarz, Udo D.; Altman, Eric I.

doi:10.1039/c7cp06059a

Title: Using ZnO–Cr ₂ O ₃ –ZnO heterostructures to characterize polarization penetration depth through non-polar films

Journal Article · Sun Jan 01 00:00:00 EST 2017 · Physical Chemistry Chemical Physics. PCCP (Print)

DOI:https://doi.org/10.1039/c7cp06059a· OSTI ID:1539884

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^[1]; Zhou, Chao ^[2]; Dagdeviren, Omur E. ^[2]; Chen, Zheng ^[2];

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Center for Research on Interface Structures and Phenomena (CRISP); Yale University; New Haven; USA; Department of Chemical and Environmental Engineering
Center for Research on Interface Structures and Phenomena (CRISP); Yale University; New Haven; USA; Department of Mechanical Engineering and Materials Science

The polarization of ZnO films on Cr₂O₃/ZnO shows that substrate polarization affects a non-polar material for <3 atomic layers.

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Research Organization:: Yale Univ., New Haven, CT (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

DOE Contract Number:: SC0014414

OSTI ID:: 1539884

Journal Information:: Physical Chemistry Chemical Physics. PCCP (Print), Vol. 19, Issue 48; ISSN 1463-9076

Publisher:: Royal Society of Chemistry

Country of Publication:: United States

Language:: English

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Title: Using ZnO–Cr 2 O 3 –ZnO heterostructures to characterize polarization penetration depth through non-polar films

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