Thermomechanical Fatigue in Sub-THz Vacuum Electron Devices
Journal Article
·
· IEEE Transactions on Electron Devices
Not provided.
- Research Organization:
- Univ. of California, Davis, CA (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- DOE Contract Number:
- FG02-99ER54518
- OSTI ID:
- 1536646
- Journal Information:
- IEEE Transactions on Electron Devices, Vol. 63, Issue 12; ISSN 0018-9383
- Publisher:
- IEEE
- Country of Publication:
- United States
- Language:
- English
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