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August 2013 |
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Acceptor Compensation in Silicon Induced by Chemomechanical Polishing
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January 1991 |
Optical properties of copper in silicon: Excitons bound to isoelectronic copper pairs
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June 1982 |
Projector augmented-wave method
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December 1994 |
Hybrid functionals based on a screened Coulomb potential
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May 2003 |
Diffusion and Solubility of Copper in Extrinsic and Intrinsic Germanium, Silicon, and Gallium Arsenide
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February 1964 |
Theory of substitutional and interstitial impurities in silicon
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November 1982 |
Deep level, quenched-in defects in silicon doped with gold, silver, iron, copper or nickel
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March 1983 |
Physics of Copper in Silicon
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January 2002 |
Transition metals in silicon
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January 1983 |
Theory of hydrogen diffusion and reactions in crystalline silicon
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May 1989 |
From ultrasoft pseudopotentials to the projector augmented-wave method
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January 1999 |
Reduction of the Linewidths of Deep Luminescence Centers in Reveals Fingerprints of the Isotope Constituents
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April 2008 |
Impurities in silicon solar cells
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April 1980 |
Energy level(s) of the dissociation product of the 1.014 eV photoluminescence copper center in n-type silicon determined by photoluminescence and deep-level transient spectroscopy
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July 2013 |
Copper related diffusion phenomena in germanium and silicon
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January 2004 |
Degradation of Gate Oxide Integrity by Metal Impurities
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December 1989 |
Interstitial copper-related center in n-type silicon
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October 1997 |
Copper-related defects in silicon
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January 2004 |
Deep-Level Transient Spectroscopy and Photoluminescence Studies of Formation and Depth Profiles of Copper Centers in Silicon Crystals Diffused with Dilute Copper
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July 2010 |
Precipitation-Induced Currents and Generation-Recombination Currents in Intentionally Contaminated Silicon P+N Junctions
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January 1977 |
Spin Resonance of Pd and Pt in Silicon
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April 1962 |
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June 2006 |
Titanium and copper in Si: Barriers for diffusion and interactions with hydrogen
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June 1992 |
Intrinsic Diffusion Coefficient of Interstitial Copper in Silicon
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August 1998 |
Dissociation of the 1.014 eV photoluminescence copper center in silicon crystal
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December 1998 |
Impurity effects in silicon for high efficiency solar cells
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May 1986 |
Evidence for a shallow Cu acceptor in Si from infrared spectroscopy and photoconductivity
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October 2014 |
Temperature dependence of the band gap of silicon
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April 1974 |
Electronic structure of copper, silver, and gold impurities in silicon
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July 1985 |
Copper-hydrogen complexes in silicon
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April 2002 |
The dissociation energy and the charge state of a copper-pair center in silicon
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January 1998 |
Copper, lithium, and hydrogen passivation of boron in c -Si
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March 1990 |
Properties of Silicon Doped with Iron or Copper
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December 1957 |
A new structure of Cu complex in Si and its photoluminescence
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January 2009 |
The Stable Site and Diffusion of Impurity Cu in Si
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December 2009 |
Native point defects in ZnO
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October 2007 |
Electronic and magnetic structure of 3 d– transition-metal point defects in silicon calculated from first principles
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January 1990 |
Self-Consistent Equations Including Exchange and Correlation Effects
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November 1965 |
Identification of copper-copper and copper-hydrogen complexes in silicon
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February 2013 |
Generalized Kohn-Sham schemes and the band-gap problem
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February 1996 |
Rich chemistry of copper in crystalline silicon
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August 1999 |
Breakdown in silicon oxides—correlation with Cu precipitates
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August 1984 |
Electrical characterization of copper related defect reactions in silicon
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February 1999 |
Electronic structure calculations for substitutional copper and monovacancies in silicon
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August 2006 |
Efficiency of ab-initio total energy calculations for metals and semiconductors using a plane-wave basis set
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July 1996 |
Degradation mechanism for silicon p+-n junctions under forward bias
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November 1981 |
Thermal expansion of AlN, sapphire, and silicon
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March 1974 |
Metal Precipitates in Silicon p‐n Junctions
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October 1960 |
Electrical properties and recombination activity of copper, nickel and cobalt in silicon
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February 1998 |
Copper Behavior in Bulk Silicon and Associated Characterization Techniques
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January 2003 |
Lattice Location and Stability of Ion Implanted Cu in Si
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February 2000 |
Hybrid functional calculations of native point defects in InN
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November 2011 |
Hydrogen interactions with defects in crystalline solids
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April 1992 |
Efficient iterative schemes for ab initio total-energy calculations using a plane-wave basis set
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October 1996 |
Impact of Fe and Cu Contamination on the Minority Carrier Lifetime of Silicon Substrates
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January 1996 |
First-principles calculations for point defects in solids
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March 2014 |
Role of Si and Ge as impurities in ZnO
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November 2009 |
Diffusion of transition-metal impurities in silicon
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December 2007 |
Inhomogeneous Electron Gas
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November 1964 |
First-principles theory of copper in silicon
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January 2004 |
The Self-Diffusion of Copper
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July 1939 |
Detection of copper contamination in silicon by surface photovoltage diffusion length measurements
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January 1999 |
Accurate Exchange-Correlation Potential for Silicon and Its Discontinuity on Addition of an Electron
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June 1986 |
Lattice location of implanted Cu in highly doped Si
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October 2000 |
Copper interactions with H, O, and the self-interstitial in silicon
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July 2003 |
Passivation of copper in silicon by hydrogen
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December 2005 |
Four-copper complexes in Si and the Cu-photoluminescence defect: A first-principles study
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October 2011 |
Deep levels of copper in silicon
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September 1987 |
Electric Degradation and Defect Formation of Silicon Due to Cu, Fe, and Ni Contamination
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January 1992 |
New theoretical approach of transition-metal impurities in semiconductors
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January 1989 |
Copper in silicon n+-p junctions
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February 1972 |
Störstellenreaktionen bei Cu-dotierten Siliziumkristallen
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June 1986 |
Electronic state of interstitial Cu in bulk Si: Density functional calculations
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April 2006 |
Characterization of metallic impurities in Si using a recombination-lifetime correlation method
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October 1997 |
Formation of copper precipitates in silicon
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December 1999 |
Copper–hydrogen complexes in silicon
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December 1999 |
Reducing Dzyaloshinskii-Moriya interaction and field-free spin-orbit torque switching in synthetic antiferromagnets
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May 2021 |
High-resolution X-ray luminescence extension imaging
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February 2021 |
Electronic structure of AlFeN films exhibiting crystallographic orientation change from c- to a-axis with Fe concentrations and annealing effect
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February 2020 |
Copper-related defects in silicon
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December 1999 |