Role of grain size on redox induced compositional stresses in Pr doped ceria thin films
Journal Article
·
· Physical Chemistry Chemical Physics. PCCP (Print)
- School of Engineering; Brown University; Providence; USA
- Materials Processing Center and Department of Materials Science and Engineering; Massachusetts Institute of Technology; Cambridge; USA
- Materials Processing Center and Department of Materials Science and Engineering; Massachusetts Institute of Technology; Cambridge; USA; International Institute for Carbon Neutral Energy Research (WPI-I2CNER)
- Kazuo Inamori School of Engineering; Alfred University; Alfred; USA
In-situwafer curvature and x-ray diffraction measurements were employed to investigate the grain size dependence of stress and strain in Pr doped ceria thin films.
- Research Organization:
- Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- DOE Contract Number:
- SC0002633
- OSTI ID:
- 1535187
- Journal Information:
- Physical Chemistry Chemical Physics. PCCP (Print), Vol. 19, Issue 19; ISSN 1463-9076
- Publisher:
- Royal Society of Chemistry
- Country of Publication:
- United States
- Language:
- English
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