Distance-of-Flight Mass Spectrometry: What, Why, and How?

Dennis, Elise A.; Gundlach-Graham, Alexander W.; Ray, Steven J.; Enke, Christie G.; Hieftje, Gary M.

doi:10.1007/s13361-016-1458-1

Title: Distance-of-Flight Mass Spectrometry: What, Why, and How?

Journal Article · Thu Aug 25 00:00:00 EDT 2016 · Journal of the American Society for Mass Spectrometry

DOI:https://doi.org/10.1007/s13361-016-1458-1· OSTI ID:1533433

Dennis, Elise A.; Gundlach-Graham, Alexander W.; Ray, Steven J.; Enke, Christie G.; Hieftje, Gary M.

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Research Organization:: Indiana Univ., Bloomington, IN (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

DOE Contract Number:: FG02-98ER14890

OSTI ID:: 1533433

Journal Information:: Journal of the American Society for Mass Spectrometry, Vol. 27, Issue 11; ISSN 1044-0305

Publisher:: American Society for Mass Spectrometry

Country of Publication:: United States

Language:: English

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