In Situ Observation of Single Ion Damage in Electronic Materials.
Abstract not provided.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1530965
- Report Number(s):
- SAND2015-5694C; 665007
- Resource Relation:
- Journal Volume: 21; Journal Issue: S3; Conference: Proposed for presentation at the Microscopy and Microanalysis 2015 held August 2-6, 2015 in Portland, OR.
- Country of Publication:
- United States
- Language:
- English
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