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High precision tilt stage as a key element to a universal test mirror for characterization and calibration of slope measuring instruments

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.4950729· OSTI ID:1530236
 [1];  [2];  [1];  [3];  [4];  [1];  [5];  [6];  [7];  [8];  [5];  [8]
  1. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)
  2. KLA-Tencor Corp., Milpitas, CA (United States)
  3. The École nationale supérieure d’ingénieurs de Caen, Caen (France)
  4. Physikalisch-Technische Bundesanstalt, Braunschweig (Germany)
  5. Physik Instrumente (PI), Karlsruhe (Germany)
  6. Diablo Valley College, Pleasant Hill, CA (United States)
  7. Helmholtz Zentrum, Berlin (Germany); Technical Univ. of Berlin (Germany)
  8. Helmholtz Zentrum, Berlin (Germany)
The ultimate performance of surface slope metrology instrumentation, such as long trace profilers and auto-collimator based deflectometers, is limited by systematic errors that are increased when the entire angular range is used for metrology of significantly curved optics. At the ALS X-Ray Optics Laboratory, in collaboration with the HZB/BESSY-II and PTB (Germany) metrology teams, we are working on a calibration method for deflectometers, based on a concept of a universal test mirror (UTM) [V. V. Yashchuk et al., Proc. SPIE 6704, 67040A (2007)]. Potentially, the UTM method provides high performance calibration and accounts for peculiarities of the optics under test (e.g., slope distribution) and the experimental arrangement (e.g., the distance between the sensor and the optic under test). At the same time, the UTM calibration method is inherently universal, applicable to a variety of optics and experimental arrangements. In this work, we present the results of tests with a key component of the UTM system, a custom high precision tilt stage, which has been recently developed in collaboration with Physik Instrumente, GmbH. The tests have demonstrated high performance of the stage and its capability (after additional calibration) to provide angular calibration of surface slope measuring profilers over the entire instrumental dynamic range with absolute accuracy better than 30 nrad. The details of the stage design and tests are presented. We also discuss the foundation of the UTM method and calibration algorithm, as well as the possible design of a full scale UTM system.
Research Organization:
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
Grant/Contract Number:
AC02-05CH11231
OSTI ID:
1530236
Journal Information:
Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 5 Vol. 87; ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English

References (42)

The Long Trace Profilers book January 2008
The Nanometer Optical Component Measuring Machine book January 2008
Use of an optical profiling instrument for the measurement of the figure and finish of optical quality surfaces journal May 1986
The Diamond-NOM: A non-contact profiler capable of characterizing optical figure error with sub-nanometre repeatability
  • Alcock, S. G.; Sawhney, K. J. S.; Scott, S.
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 616, Issue 2-3 https://doi.org/10.1016/j.nima.2009.10.137
journal May 2010
An LTP stitching procedure with compensation of instrument errors: Comparison of SOLEIL and ESRF results on strongly curved mirrors
  • Polack, François; Thomasset, Muriel; Brochet, Sylvain
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 616, Issue 2-3 https://doi.org/10.1016/j.nima.2009.10.166
journal May 2010
Sub-microradian surface slope metrology with the ALS Developmental Long Trace Profiler
  • Yashchuk, Valeriy V.; Barber, Samuel; Domning, Edward E.
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 616, Issue 2-3 https://doi.org/10.1016/j.nima.2009.10.175
journal May 2010
Autocollimators for deflectometry: Current status and future progress
  • Geckeler, Ralf D.; Just, Andreas; Krause, Michael
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 616, Issue 2-3 https://doi.org/10.1016/j.nima.2009.11.021
journal May 2010
Upgrade of long trace profiler for characterization of high-precision X-ray mirrors at SPring-8
  • Senba, Y.; Kishimoto, H.; Ohashi, H.
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 616, Issue 2-3 https://doi.org/10.1016/j.nima.2009.12.007
journal May 2010
Characterization and calibration of 2nd generation slope measuring profiler
  • Siewert, Frank; Buchheim, Jana; Zeschke, Thomas
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 616, Issue 2-3 https://doi.org/10.1016/j.nima.2009.12.033
journal May 2010
Characterization of the error budget of Alba-NOM
  • Nicolas, Josep; Martínez, Juan Carlos
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 710 https://doi.org/10.1016/j.nima.2012.10.125
journal May 2013
Approaching sub-50 nanoradian measurements by reducing the saw-tooth deviation of the autocollimator in the Nano-Optic-Measuring Machine
  • Qian, Shinan; Geckeler, Ralf D.; Just, Andreas
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 785 https://doi.org/10.1016/j.nima.2015.02.065
journal June 2015
Comparison of angle standards with the aid of a high-resolution angle encoder journal October 2009
Using a straightness reference in obtaining more accurate surface profiles from a long trace profiler journal January 1992
The Nanometer Optical Component Measuring Machine: a new Sub-nm Topography Measuring Device for X-ray Optics at BESSY
  • Siewert, Frank
  • SYNCHROTRON RADIATION INSTRUMENTATION: Eighth International Conference on Synchrotron Radiation Instrumentation, AIP Conference Proceedings https://doi.org/10.1063/1.1757928
conference January 2004
Optimal measurement strategies for effective suppression of drift errors journal November 2009
Calibration of high-resolution electronic autocollimators against an angle comparator journal September 2003
A shearing-based method for the simultaneous calibration of angle measuring devices journal September 2014
Capabilities and limitations of the self-calibration of angle encoders journal March 2014
The new PTB angle comparator journal July 1998
On the characterization of ultra-precise X-ray optical components: advances and challenges in ex situ metrology journal August 2014
Diffraction-limited storage rings – a window to the science of tomorrow journal August 2014
Developmental long-trace profiler using optimally aligned mirror-based pentaprism journal May 2011
Advanced environmental control as a key component in the development of ultrahigh accuracy ex situ metrology for x-ray optics journal October 2015
Specification of x-ray mirrors in terms of system performance: new twist to an old plot journal February 2015
Modeling of surface metrology of state-of-the-art x-ray mirrors as a result of stochastic polishing process journal July 2016
Correlation analysis of surface slope metrology measurements of high quality x-ray optics conference September 2013
Specification of x-ray mirrors in terms of system performance: a new twist to an old plot conference September 2014
Modeling of surface metrology of state-of-the-art x-ray mirrors as a result of stochastic polishing process conference November 2015
Positioning errors of pencil-beam interferometers for long trace profilers conference August 2006
Air convection noise of pencil-beam interferometer for long trace profiler conference August 2006
ESAD shearing deflectometry: potentials for synchrotron beamline metrology conference August 2006
Optimized use and calibration of autocollimators in deflectometry conference September 2007
Proposal for a universal test mirror for characterization of slope measuring instruments conference September 2007
Distance-dependent influences on angle metrology with autocollimators in deflectometry conference August 2008
Performance of the upgraded LTP-II at the ALS Optical Metrology Laboratory conference August 2008
Requirements on hard x-ray grazing incidence optics for European XFEL: analysis and simulation of wavefront transformations conference May 2009
Automated suppression of errors in LTP-II slope measurements with x-ray optics conference September 2011
Design Of A Long Trace Surface Profiler conference April 1987
Precision measurement of parity nonconservation in cesium journal May 1999
Ultra-precise characterization of LCLS hard X-ray focusing mirrors by high resolution slope measuring deflectometry journal January 2012
Scanning deflectometric form measurement avoiding path-dependent angle measurement errors journal January 2010
Recent Developments in UV Optics for Ultra-Short, Ultra-Intense Coherent Light Sources journal January 2015

Cited By (7)

Environmental influences on autocollimator-based angle and form metrology journal February 2019
Influence of the air’s refractive index on precision angle metrology with autocollimators journal May 2018
New operational mode of the pencil beam interferometry based LTP conference September 2016
Development of a high performance surface slope measuring system for two-dimensional mapping of x-ray optics conference September 2017
New twist in the optical schematic of surface slope measuring long trace profiler conference September 2017
The ALS OSMS: Optical Surface Measuring System for high accuracy two-dimensional slope metrology with state-of-the-art x-ray mirrors conference November 2018
Transfer of autocollimator calibration for use with scanning gantry profilometers for accurate determination of surface slope and curvature of state-of-the-art x-ray mirrors conference October 2019

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