Opto-electronic properties of Co-Zn-Ni-O films deposited by RF-sputtering at ambient-temperature

Ford, J. C.; Zakutayev, A.; Ndione, P. F.; Sigdel, A. K.; Widjonarko, N. E.; Parilla, P. A.; Van Zeghbroeck, B.; Berry, J. J.; Ginley, D. S.; Perkins, J. D.

doi:10.1016/j.jallcom.2019.05.275

Title: Opto-electronic properties of Co-Zn-Ni-O films deposited by RF-sputtering at ambient-temperature

Journal Article · Sun Sep 01 00:00:00 EDT 2019 · Journal of Alloys and Compounds

DOI:https://doi.org/10.1016/j.jallcom.2019.05.275· OSTI ID:1526771

Ford, J. C.; Zakutayev, A.; Ndione, P. F.; Sigdel, A. K.; Widjonarko, N. E.; Parilla, P. A.; Van Zeghbroeck, B.; Berry, J. J.; Ginley, D. S.; Perkins, J. D.

Co-Zn-Ni-O thin films were grown on glass at ambient temperature (T_S < 65 °C) by co- sputtering from Co₃O₄, ZnO, and NiO targets to determine the structural and opto-electronic properties across the ternary composition space. Compositional domains with spinel, wurtzite rock-salt, and mixed phases were observed, albeit with very weak X-ray diffraction peaks, overall suggesting the likely presence of a co-existent amorphous component. The electrical conductivity had a maximum value of ~35 S/cm that occurs where the optical absorption is also the strongest. The work functions range from 5.0-5.8 eV for all samples, but with no clear composition-based trends. Overall, it appears that optoelectronic properties of the Co-Zn-Ni-O materials are much less sensitive to substrate temperature compared to other p-type oxide semiconductors, resulting in technologically-relevant ambient-temperature-deposited thin films.

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Research Organization:: Energy Frontier Research Centers (EFRC) (United States). Center for Next Generation of Materials by Design: Incorporating Metastability (CNGMD); National Renewable Energy Laboratory (NREL), Golden, CO (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC36-08GO28308

OSTI ID:: 1526771

Alternate ID(s):: OSTI ID: 1544538

Report Number(s):: NREL/JA-5K00-68962; S0925838819319577; PII: S0925838819319577

Journal Information:: Journal of Alloys and Compounds, Journal Name: Journal of Alloys and Compounds Vol. 801 Journal Issue: C; ISSN 0925-8388

Publisher:: ElsevierCopyright Statement

Country of Publication:: Netherlands

Language:: English

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Cited by: 5 works

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71 CLASSICAL AND QUANTUM MECHANICS
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Title: Opto-electronic properties of Co-Zn-Ni-O films deposited by RF-sputtering at ambient-temperature

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