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Title: In situ measurement of temperature and reduction of rutile titania using energy dispersive x-ray diffraction

Journal Article · · Journal of the European Ceramic Society

Using in situ energy dispersive x-ray diffraction (EDXRD) the average specimen temperature of TiO2 in the steady state of flash is experimentally determined. Comparison of the microstructure for flash sintering and conventional sintering in addition to the temperature determined from calibration of the unit cell expansion indicates that rapid Joule heating during flash sintering causes densification and grain growth comparable with conventional sintering. An average temperature approximation model is proposed to account for greybody radiation and thermal conduction. In conclusion, the inhomogeneity of the grain growth across the sample length is confirmed to correlate with inhomogeneity in temperature distribution and this suggests a current induced Peltier effect in n-type TiO2.

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Organization:
US Department of the Navy, Office of Naval Research (ONR); Argonne National Laboratory, Advanced Photon Source; USDOE
Grant/Contract Number:
AC02-06CH11357
OSTI ID:
1524579
Journal Information:
Journal of the European Ceramic Society, Vol. 38, Issue 16; ISSN 0955-2219
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 22 works
Citation information provided by
Web of Science

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Cited By (1)

Field‐assisted heating of Gd‐doped ceria thin film journal December 2019