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Title: A maximally particle-hole asymmetric spectrum emanating from a semi-Dirac point

Journal Article · · Journal of Physics. Condensed Matter
ORCiD logo [1]; ORCiD logo [2]
  1. Beijing Normal Univ., Beijing (People's Republic of China). Dept. of Physics and Center fro Advanced Quantum Studies
  2. Univ. of California, Davis, CA (United States). Dept. of Physics

Tight binding models have proven an effective means of revealing Dirac (massless) dispersion, flat bands (infinite mass), and intermediate cases such as the semi-Dirac (sD) dispersion. This approach is extended to a three band model that yields, with chosen parameters in a two-band limit, a closed line with maximally asymmetric particle-hole dispersion: infinite mass holes, zero mass particles. The model retains the sD points for a general set of parameters. Adjacent to this limiting case, hole Fermi surfaces are tiny and needle-like. A pair of large electron Fermi surfaces at low doping merge and collapse at half filling to a flat (zero energy) closed contour with infinite mass along the contour and enclosing no carriers on either side, while the hole Fermi surface has shrunk to a point at zero energy, also containing no carriers. The tight binding model is used to study several characteristics of the dispersion and density of states. The model inspired generalization of sD dispersion to a general ±$$ \sqrt{k_x^{2n} +k_y^{2m}}$$ form, for which analysis reveals that both $$n$$ and $$m$$ must be odd to provide a diabolical point with topological character. Evolution of the Hofstadter spectrum of this three band system with interband coupling strength is presented and discussed.

Research Organization:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). National Energy Research Scientific Computing Center (NERSC)
Sponsoring Organization:
USDOE Office of Science (SC)
DOE Contract Number:
AC02-05CH11231
OSTI ID:
1523473
Journal Information:
Journal of Physics. Condensed Matter, Vol. 30, Issue 7; ISSN 0953-8984
Publisher:
IOP Publishing
Country of Publication:
United States
Language:
English

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