Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Cr(110) texture induced by epitaxy on Al2O3 (0001) substrates: Preferential grain growth in the ⟨001⟩ direction

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4801083· OSTI ID:1511359
 [1];  [2]
  1. National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States); Univ. of California, Berkeley, CA (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  2. Univ. of California, Berkeley, CA (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Chromium exhibits (110) textured growth on Al2O3(0001) substrates induced by epitaxy. Epitaxy occurs in nine distinct orientations, leading to a polycrystalline film of grains with (110) out-of-plane orientation but different in-plane orientations. For e-beam evaporated films, scanning electron microscopy shows acicular Cr grains elongated in the 001 direction. Grain boundaries occur along (110) and (110) planes, which is explained by the low surface energy of {110} planes in the bcc structure. The direction of the long axes of the grains relative to the substrate is defined by the underlying hexagonal symmetry of the substrate, leading to a unique tri-directional microstructure.
Research Organization:
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22), Materials Sciences & Engineering Division (SC-22.2)
Grant/Contract Number:
AC02-05CH11231
OSTI ID:
1511359
Journal Information:
Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 14 Vol. 102; ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English

References (11)

Interprétation de la croissance d'un dépôt épitaxique métallique sur un métal à partir du modèle de dislocations interfaciales journal July 1971
Texture of MBE grown Cr films on α-Al2O3(0001): the occurrence of Nishiyama-Wassermann (NW) and Kurdjumov-Sachs (KS) related orientation relationships journal January 2003
Application of coincidence of reciprocal lattice point model to metal/sapphire hetero interfaces journal October 2010
Nanostructured chromium nitride films with a valley of residual stress journal January 2005
Evolution of anisotropic microstructure and residual stress in sputtered Cr films journal December 2002
Oscillatory interlayer coupling and giant magnetoresistance in epitaxial Fe/Cr(211) and (100) superlattices journal December 1993
Spin-density wave in polycrystalline Cr films from infrared reflectivity journal December 2007
Resonant impurity scattering and electron-phonon scattering in the electrical resistivity of Cr thin films journal October 2009
Giant Magnetoresistance of (001)Fe/(001)Cr Magnetic Superlattices journal November 1988
Exchange Bias as a Probe of the Incommensurate Spin-Density Wave in Epitaxial Fe / Cr ( 001 ) journal December 2006
Surface morphology and uniaxial magnetic anisotropy of Fe films deposited by dual ion beam sputtering journal July 2001

Figures / Tables (4)


Similar Records

Texture of CoSi2 Films on Si(111) (110) and (001) Substrates
Journal Article · Fri Dec 30 23:00:00 EST 2011 · Thin Solid Films · OSTI ID:1042083

Preparation and structural characterization of FeCo epitaxial thin films on insulating single-crystal substrates
Journal Article · Sat May 15 00:00:00 EDT 2010 · Journal of Applied Physics · OSTI ID:21476200

On the initial stages of AlN thin-film growth onto (0001) oriented Al{sub 2}O{sub 3} substrates by molecular beam epitaxy
Journal Article · Thu Dec 31 23:00:00 EST 1998 · Journal of Applied Physics · OSTI ID:289247

Related Subjects