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Title: Nanoscale elastic strain mapping of polycrystalline materials

Abstract

Measuring elastic strain with nanoscale resolution has historically been very difficult and required a marriage of simulations and experiments. Nano precession electron diffraction provides excellent strain and spatial resolution but has traditionally only been applied to single-crystalline semiconductors. The present study illustrates that the technique can also be applied to polycrystalline materials. The strain resolution was determined to be 0.15% and 0.10% for polycrystalline copper and boron carbide, respectively. Local strain maps were obtained near grain boundaries in boron carbide and dislocations in magnesium and shown to correlate with expected values, thus demonstrating the efficacy of this technique. This study demonstrates that nano precession electron diffraction can be extended from semiconductor devices to polycrystalline metals and ceramics to map nanoscale elastic strain fields with high strain resolution.

Authors:
ORCiD logo [1];  [1]
  1. Johns Hopkins Univ., Baltimore, MD (United States)
Publication Date:
Research Org.:
Johns Hopkins Univ., Baltimore, MD (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1510472
Grant/Contract Number:  
FG02-07ER46437
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Materials Research Letters
Additional Journal Information:
Journal Volume: 6; Journal Issue: 4; Journal ID: ISSN 2166-3831
Publisher:
Taylor and Francis
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Rottmann, Paul F., and Hemker, Kevin J. Nanoscale elastic strain mapping of polycrystalline materials. United States: N. p., 2018. Web. doi:10.1080/21663831.2018.1436609.
Rottmann, Paul F., & Hemker, Kevin J. Nanoscale elastic strain mapping of polycrystalline materials. United States. doi:10.1080/21663831.2018.1436609.
Rottmann, Paul F., and Hemker, Kevin J. Tue . "Nanoscale elastic strain mapping of polycrystalline materials". United States. doi:10.1080/21663831.2018.1436609. https://www.osti.gov/servlets/purl/1510472.
@article{osti_1510472,
title = {Nanoscale elastic strain mapping of polycrystalline materials},
author = {Rottmann, Paul F. and Hemker, Kevin J.},
abstractNote = {Measuring elastic strain with nanoscale resolution has historically been very difficult and required a marriage of simulations and experiments. Nano precession electron diffraction provides excellent strain and spatial resolution but has traditionally only been applied to single-crystalline semiconductors. The present study illustrates that the technique can also be applied to polycrystalline materials. The strain resolution was determined to be 0.15% and 0.10% for polycrystalline copper and boron carbide, respectively. Local strain maps were obtained near grain boundaries in boron carbide and dislocations in magnesium and shown to correlate with expected values, thus demonstrating the efficacy of this technique. This study demonstrates that nano precession electron diffraction can be extended from semiconductor devices to polycrystalline metals and ceramics to map nanoscale elastic strain fields with high strain resolution.},
doi = {10.1080/21663831.2018.1436609},
journal = {Materials Research Letters},
issn = {2166-3831},
number = 4,
volume = 6,
place = {United States},
year = {2018},
month = {2}
}

Journal Article:
Free Publicly Available Full Text
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