Framework for Modelling Interface Degradation in Photovoltaic Modules at the Molecular Level
- Stanford University; Exponent Inc.
- Stanford University; Ghent University
- National Renewable Energy Laboratory (NREL), Golden, CO (United States)
- Stanford University
A significant challenge facing the solar industry is developing a reliable method to accurately predict photovoltaic module reliability over decades-long operating lifetimes. For the specific case of encapsulant adhesion-where interface delamination directly leads to reduced module efficiency- predictive models are critical for assessing long term reliability of new module materials over time frames conducive to research and development. We thus present a framework for modelling the temporal evolution of encapsulant adhesion by accounting for chemicaldegradation mechanisms at the molecular level. The model is developed though an unprecedented survey of encapsulant adhesion energy measurements from lab and field- aged modules with agingtimes spanning months to nearly three decades. Chemical analyses of new and aged EVA encapsulants are conducted to identify the dominant degradation mechanisms for modelling interface adhesion: deactivation, polymer chain scission, and hydrolytic polymerization. The strength of this framework is in the model's modularity, which renders it adaptable to any type of aging environment and encapsulation material.
- Research Organization:
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
- Sponsoring Organization:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
- DOE Contract Number:
- AC36-08GO28308
- OSTI ID:
- 1508494
- Report Number(s):
- NREL/CP-5K00-70818
- Resource Relation:
- Conference: Presented at the 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC), 10-15 June 2018, Waikoloa Village, Hawaii
- Country of Publication:
- United States
- Language:
- English
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