Evaluation of the PID-s Susceptibility of Modules Encapsulated in Materials of Varying Resistivity
- Dow Chemical Company
- National Renewable Energy Laboratory (NREL), Golden, CO (United States)
A common mechanism of potential-induced degradation is by shunting (PID-s) in PV modules, usually associated with the transport of sodium ions (Na+) through the encapsulant and penetrating the front junction of solar cells under voltage stress. Encapsulants with high volume resistivity have been suggested as a potentially cost-effective solution to this degradation mechanism. In this work, we examine three polyolefin elastomer (POE) encapsulants with volume resistivity varying over two orders of magnitude (ranging from 9 x 10^13 to 1 x 10^16 ..omega.. cm) that show equivalent and complete resistance to PID at the damp heat stress test level of 85 degrees C and 85% relative humidity and -1000 V system voltage stress. Performance is compared with a PID-susceptible ethylene vinyl acetate (EVA) encapsulant with resistivity 1 x 10^13 ..omega.. cm. The independence of PID susceptibility with respect to the resistivity of the polyolefin is attributed to the impermeability of POEs to Na + ions. Specific ions (i.e. Na + ), rather than charge-carrying species in general, are responsible for this degradation mechanism.
- Research Organization:
- National Renewable Energy Laboratory (NREL), Golden, CO (United States)
- Sponsoring Organization:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S)
- DOE Contract Number:
- AC36-08GO28308
- OSTI ID:
- 1507667
- Report Number(s):
- NREL/CP-5K00-72450
- Country of Publication:
- United States
- Language:
- English
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