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Title: Dielectric resonator method for determining gap symmetry of superconductors through anisotropic nonlinear Meissner effect

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.5090130· OSTI ID:1613014

We present a new measurement method which can be used to image the gap nodal structure of superconductors whose pairing symmetry is under debate. This technique utilizes a high quality factor microwave resonance involving the sample of interest. While supporting a circularly symmetric standing wave current pattern, the sample is perturbed by a scanned laser beam, creating a photoresponse that was previously shown to reveal the superconducting gap anisotropy. Simulation and the measurement of the photoresponse of an unpatterned Nb film show less than 8% anisotropy, as expected for a superconductor with a nearly isotropic energy gap along with expected systematic uncertainty. On the other hand, measurement of a YBa2Cu3O7-δ thin film shows a clear 4-fold symmetric image with ~12.5% anisotropy, indicating the well-known 4-fold symmetric d x 2 - y 2 gap nodal structure in the ab-plane. The deduced gap nodal structure can be further cross-checked by low temperature surface impedance data, which are simultaneously measured. The important advantage of the presented method over the previous spiral resonator method is that it does not require a complicated lithographic patterning process which limits one from testing various kinds of materials due to photoresponse arising from patterning defects. This advantage of the presented technique, and the ability to measure unpatterned samples such as planar thin films and single crystals, enables one to survey the pairing symmetry of a wide variety of unconventional superconductors.

Research Organization:
Univ. of Maryland, College Park, MD (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
Grant/Contract Number:
SC0018788; SC0012036T
OSTI ID:
1613014
Alternate ID(s):
OSTI ID: 1504508
Journal Information:
Review of Scientific Instruments, Vol. 90, Issue 4; ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 5 works
Citation information provided by
Web of Science

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