Detector performance and defect densities in CdZnTe after two-step annealing
- Korea Univ., Seoul (Korea, Republic of). Dept. of Health and Safety Science
- Korea Univ., Seoul (Korea). Dept. of Health and Safety Science
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Savannah River Site (SRS), Aiken, SC (United States). Savannah River National Lab. (SRNL)
- Korea Univ., Seoul (Korea, Republic of). School of Health and Environmental Science
Defects both micro-scale and nano-scale are plays an important role in CdZnTe(CZT) device performance. Typical micro-scale defect, Te inclusions, was removed by two-step annealing and its concentration were analyzed by IR transmission microscopy. In addition, transmission electron microscopy (TEM) measurement was employed to investigate the evolution of nano-scale defects after annealing process. Micro-twins and stacking faults were commonly observed defects in CZT as-grown and annealed CZT. The line shape defects which possibly related to the stress field around dislocations, were combine and disappear in in-situ the annealing at 200-220 °C. Frisch-grid CZT detector made of two-step annealed one exhibit better energy resolution and low backscattering counts in Cs-137 gamma spectra.
- Research Organization:
- Brookhaven National Laboratory (BNL), Upton, NY (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA), Office of Nonproliferation and Verification Research and Development (NA-22)
- Grant/Contract Number:
- SC0012704
- OSTI ID:
- 1503222
- Alternate ID(s):
- OSTI ID: 1561204
- Report Number(s):
- BNL--211450-2019-JAAM
- Journal Information:
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment, Journal Name: Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment Journal Issue: C Vol. 923; ISSN 0168-9002
- Publisher:
- ElsevierCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Similar Records
Two-step annealing to remove Te secondary-phase defects in CdZnTe while preserving the high electrical resistivity