Quantum size effects and tunable visible photoluminescence in a-Si:H/nc-Si:H superlattices
Journal Article
·
· Journal of Materials Science Materials in Electronics
- Indian Institute of Technology Guwahati, Guwahati (India)
- Ames Lab. and Iowa State Univ., Ames, IA (United States)
Quantum size effects are commonly observed in semiconductor nanocrystals and quantum dots. Here, we demonstrate unexpected quantum size effects in an unusual bulk system with multiple interfaces, consisting of alternating layers of nanocrystalline silicon (nc-Si:H) and amorphous silicon (a-Si:H) material thin films. The nc-Si:H layers consist of silicon nanocrystals embedded in an amorphous matrix, with an amorphous-crystalline interface separating the two structures. Plasma-enhanced chemical vapor deposition was utilized to grow nanocrystalline-amorphous silicon superlattices with a varying thickness of the nanocrystalline layer. Strong visible photoluminescence at room temperature was deconvoluted into individual peaks. As the nanocrystalline silicon layer thickness was increased from 5 to 20 nm, the photoluminescence spectra red-shifted with the emission wavelength varying as d2 (d is the size of the nanocrystallites), the characteristic signature underlying quantum size effects. The size d of the nanocrystals was estimated by the measured shift of the Raman peak, and could be tuned by varying the thickness of the nc-Si:H layers. High resolution transmission electron microscopy show nanocrystals with a narrow size distribution, in an amorphous matrix. We also observe long wavelength photoluminescence from interfacial states that leads to persistent photconductivity. In conclusion nanocrystalline-amorphous superlattices offer a unique pathway for synthesizing embedded nanocrystals with controlled sizes and photonic signatures.
- Research Organization:
- Ames Laboratory (AMES), Ames, IA (United States)
- Sponsoring Organization:
- USDOE
- Grant/Contract Number:
- AC02-07CH11358
- OSTI ID:
- 1502872
- Alternate ID(s):
- OSTI ID: 22976383
- Report Number(s):
- IS-J--9875
- Journal Information:
- Journal of Materials Science Materials in Electronics, Journal Name: Journal of Materials Science Materials in Electronics Journal Issue: 5 Vol. 30; ISSN 0957-4522
- Publisher:
- SpringerCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Similar Records
Defect states in nc-Si:H films investigated by surface photovoltage spectroscopy
Structural and optical properties of size controlled Si nanocrystals in Si{sub 3}N{sub 4} matrix: The nature of photoluminescence peak shift
Room temperature visible photoluminescence of silicon nanocrystallites embedded in amorphous silicon carbide matrix
Journal Article
·
Mon Feb 28 23:00:00 EST 2011
· Journal of Applied Physics
·
OSTI ID:21538146
Structural and optical properties of size controlled Si nanocrystals in Si{sub 3}N{sub 4} matrix: The nature of photoluminescence peak shift
Journal Article
·
Wed Nov 13 23:00:00 EST 2013
· Journal of Applied Physics
·
OSTI ID:22259294
Room temperature visible photoluminescence of silicon nanocrystallites embedded in amorphous silicon carbide matrix
Journal Article
·
Sat Mar 15 00:00:00 EDT 2008
· Journal of Applied Physics
·
OSTI ID:21133991