Characterization and Compensation of High Speed Digitizers
Increasingly, ADC technology is being pressed into service for single single-shot instrumentation applications that were formerly served by vacuum-tube based oscilloscopes and streak cameras. ADC technology, while convenient, suffers significant performance impairments. Thus, in these demanding applications, a quantitative and accurate representation of these impairments is critical to an understanding of measurement accuracy. We have developed a phase-plane behavioral model, implemented it in SIMULINK and applied it to interleaved, high-speed ADCs (up to 4 gigasamples/sec). We have also developed and demonstrated techniques to effectively compensate for these impairments based upon the model.
- Research Organization:
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 15016329
- Report Number(s):
- UCRL-PROC-211090; TRN: US200513%%135
- Resource Relation:
- Journal Volume: 1; Conference: Presented at: IMTC 2005 Instrumentation and Measurement Technology Conference, Ottawa, Ontario (CA), 05/17/2005--05/19/2005; Other Information: PBD: 4 Apr 2005
- Country of Publication:
- United States
- Language:
- English
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