Beam damage of poly(vinyl chloride) [PVC] as observed by x-ray photoelectron spectroscopy at 143 K, 303 K and 373 K.

Journal Article · Sat Mar 08 00:00:00 EST 2003 · Surface Science Spectra

DOI:https://doi.org/10.1116/11.20030903· OSTI ID:15016099

Engelhard, Mark H; Baer, Donald R; Lea, Alan S

X-ray beam damage is often observed during surface analysis of beam sensitive materials as indicated in the introduction to this issue and in a wide variety of references. While damage occurs in a wide range of materials, those that are most susceptible to damage are materials that contain low energy covalent bonds such as polymers or other organic materials. Even amongst the relatively easily damaged polymers, there is a wide range of damage rates. The data reported in this submission was collected in the interest of comparing the rates of damage produced by x-ray and electron irradiation of different materials. The focus of this submission is x-ray damage of bulk poly(vinyl chloride) PVC since it is a readily available material. The temperature of the sample holder was controlled during irradiation of the PVC in order to determine the extent to which localized sample heating affects the rate of damage. PVC degrades by photoionization, resulting in the production of HCl through H and Cl bond cleavage. Bulk PVC has previously been the focus of an x-ray damage study involving many laboratories throughout the world. For comparison to the bulk PVC data, damage rates for thin films of poly(2-chloroethyl methacrylate) (PCEMA) are also reported for the same three temperatures. Measurements of several relatively common materials on one instrument can provide a data base that allows damage rates on one instrument to be linked or compared to other damage data in the literature. In addition to the PCEMA films and bulk PVC, other data collected at the same x-ray parameters include thin films of PVC (for which damage rates are essentially identical to the bulk material) and of poly(acrylonitrile) PAN which is more stable that either PCEMA or PVC. An additional set of PVC data for a different instrument is also included in the volume. X-ray beams used for XPS produce less damage in materials than electrons used for AES analysis. This is due to both th e weaker interaction between x-rays and materials (relative to electrons) and the deeper penetration of x-rays into the material producing a lower damage density. Although the rates of damage for x-rays and electrons differ, many of the processes are similar. Both electron and x-ray damage has been collected for PVC and PAN as reported in this volume of SSS8,9,12 and summarized in the introduction. The overall damage rates for PVC and PAN differ by an order of magnitude, but the ratios of the electron and x-ray damage rates for these two materials are nearly the same.

• Research Organization: Pacific Northwest National Lab., Richland, WA (US), Environmental Molecular Sciences Laboratory (US)
• Sponsoring Organization: US Department of Energy (US)
• DOE Contract Number: AC05-76RL01830
• OSTI ID: 15016099
• Report Number(s): PNNL-SA-39575; SSSPEN; 8221; KP1301030; TRN: US0501849
• Journal Information: Surface Science Spectra, Vol. 10; Other Information: PBD: 8 Mar 2003; ISSN 1055-5269
• Country of Publication: United States
• Language: English

Related Subjects

38 RADIATION CHEMISTRY, RADIOCHEMISTRY, AND NUCLEAR CHEMISTRY
CLEAVAGE
IRRADIATION
PHOTOIONIZATION
X-RAY PHOTOELECTRON SPECTROSCOPY
PVC
X RADIATION
CHEMICAL RADIATION EFFECTS
ENVIRONMENTAL MOLECULAR SCIENCES LABORATORY
XPS
X-RAY PHOTOELECTRON SPECTROSCOPY
PVC
POLY VINYL CHLORIDE
X-RAY DAMAGE
DAMAGE
BEAM EFFECTS
POLY (VINYL CHLORIDE)