High-resolution crystal spectrometer for the 10-60 (angstrom) EUV region
Journal Article
·
· Review of Scientific Instruments
OSTI ID:15014453
A vacuum crystal spectrometer with nominal resolving power approaching 1000 is described for measuring emission lines with wavelength in the extreme ultraviolet region up to 60 Angstroms. The instrument utilizes a flat octadecyl hydrogen maleate (OHM) crystal and a thin-window 1-D position-sensitive gas proportional detector. This detector employs a 1 {micro}m-thick 100 x8 mm{sup 2} aluminized polyimide window and operates at one atmosphere pressure. The spectrometer has been implemented on the Livermore electron beam ion traps. The performance of the instrument is illustrated in measurements of the newly discovered magnetic field-sensitive line in Ar{sup 8+}.
- Research Organization:
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 15014453
- Report Number(s):
- UCRL-JRNL-202681; RSINAK; TRN: US0800842
- Journal Information:
- Review of Scientific Instruments, Vol. 75, Issue 10; ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
Similar Records
High-resolution crystal spectrometer for the 10-60 A extreme ultraviolet region
Thin-window high-efficiency position sensitive proportional counter for the vacuum flat crystal spectrometers on the Lawrence Livermore National Laboratory electron beam ion trap (abstract)
Flat-field grating spectrometer for high-resolution soft x-ray and EUV measurements on an electron beam ion trap
Journal Article
·
Fri Oct 01 00:00:00 EDT 2004
· Review of Scientific Instruments
·
OSTI ID:15014453
+1 more
Thin-window high-efficiency position sensitive proportional counter for the vacuum flat crystal spectrometers on the Lawrence Livermore National Laboratory electron beam ion trap (abstract)
Journal Article
·
Mon Jan 01 00:00:00 EST 2001
· Review of Scientific Instruments
·
OSTI ID:15014453
+2 more
Flat-field grating spectrometer for high-resolution soft x-ray and EUV measurements on an electron beam ion trap
Journal Article
·
Sat Mar 27 00:00:00 EST 2004
· Review of Scientific Instruments
·
OSTI ID:15014453
+4 more