EXTENDED DEFECTS: POLARIZED LIGHT MICROSCOPY DELINEATION AND SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHY RATIFICATION
Journal Article
·
· Japanese Journal of Applied Physics
No abstract prepared.
- Research Organization:
- Brookhaven National Laboratory, National Synchrotron Light Source (US)
- Sponsoring Organization:
- DOE/OFFICE OF SCIENCE (US)
- DOE Contract Number:
- AC02-98CH10886
- OSTI ID:
- 15008421
- Report Number(s):
- BNL--72854-2004-JA
- Journal Information:
- Japanese Journal of Applied Physics, Journal Name: Japanese Journal of Applied Physics Journal Issue: Part 2, No.9A/B Vol. 42; ISSN 0021-4922
- Country of Publication:
- United States
- Language:
- English
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