Effects of Dislocations on Minority Carrier Lifetime in Dislocated Float Zone Silicon
Conference
·
· 12th Workshop on Crystalline Silicon Solar Cell Materials and Processes: Extended Abstracts and Papers from the workshop held 11-14 August 2002, Breckenridge, Colorado
OSTI ID:15006762
We present a correlation of Microwave Photoconductance Decay minority carrier lifetime with dislocation density in high purity Float Zone silicon. Electron Beam Induced Current (EBIC) images were carefully aligned to lifetime maps and depth profiling of individual defect electrical activity was done by varying the bias of Schottky diodes. The data presented provides a relationship between lifetime variations and EBIC contrast, based on dislocation density and impurity decoration in the near surface zone.
- Research Organization:
- National Renewable Energy Lab., Golden, CO. (US)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- AC36-99GO10337;
- OSTI ID:
- 15006762
- Report Number(s):
- NREL/CP-520-35652
- Resource Type:
- Conference paper/presentation
- Conference Information:
- Journal Name: 12th Workshop on Crystalline Silicon Solar Cell Materials and Processes: Extended Abstracts and Papers from the workshop held 11-14 August 2002, Breckenridge, Colorado
- Country of Publication:
- United States
- Language:
- English
Similar Records
Investigation of Electrical Activity of Dislocation and Grain Boundary in Polycrystalline Float Zone Silicon
Silicon float-zone crystal growth as a tool for the study of defects and impurities
Effect of nitrogen doping on microdefects and minority charge carrier lifetime of high-purity, dislocation-free and multicrystalline silicon
Conference
·
Wed Apr 30 20:00:00 EDT 2003
·
OSTI ID:15004261
Silicon float-zone crystal growth as a tool for the study of defects and impurities
Conference
·
Mon Jun 19 20:00:00 EDT 2000
·
OSTI ID:757170
Effect of nitrogen doping on microdefects and minority charge carrier lifetime of high-purity, dislocation-free and multicrystalline silicon
Book
·
Fri Dec 30 23:00:00 EST 1994
·
OSTI ID:191021