The Results of Raster-Scan Laser Conditioning Studies on DKDP Triplers Using Nd: YAG and Excimer Lasers

Conference · Thu Nov 01 04:00:00 EST 2001

OSTI ID:15004629

Runkel, M; Neeb, K; Staggs, M; Auerbach, J; Burnham, A

In this paper we present the results of damage tests performed at 1064 and 355-nm at 8-10 ns on conventional and rapid growth DKDP tripler crystals. The crystals were laser conditioned prior to damage testing by raster scanning using either Nd:YAG (1064 and 355 nm, 8-10ns) or excimer lasers at 248, 308 or 351 nm with pulse durations of approximately 30-47 ns. The results show that it is possible to attain increases in 355-nm damage probability fluences of 2X for excimer conditioning at 248 and 308 nm. However these wavelengths can induce absorption sufficient to induce bulk fracture by thermal shock when impurities such as arsenic, rubidium and sulfur are present in the crystals in sufficient quantity. Tests to evaluate the efficiency of 351-nm conditioning (XeF excimer) show improvements of 2X and that thermal fracture by induced absorption is not a problem. We also discuss our recent discovery that low fluence raster scanning at UV wavelengths leads to 1064-nm damage thresholds of over 100 J/cm{sup 2} (10-ns pulses).

• Research Organization: Lawrence Livermore National Lab., CA (US)
• Sponsoring Organization: US Department of Energy (US)
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 15004629
• Report Number(s): UCRL-JC-144299
• Country of Publication: United States
• Language: English

Related Subjects

38 RADIATION CHEMISTRY, RADIOCHEMISTRY, AND NUCLEAR CHEMISTRY
ABSORPTION
ARSENIC
EFFICIENCY
EXCIMER LASERS
FRACTURES
IMPURITIES
LASERS
PROBABILITY
RUBIDIUM
SULFUR
TESTING
THERMAL FRACTURES
THERMAL SHOCK
WAVELENGTHS