Photovoltaic Manufacturing Cost and Throughput Improvements for Thin Film CIGS-Based Modules: Final Technical Report, July 1998 -- September 2001

Technical Report · Mon Apr 01 00:00:00 EST 2002

DOI:https://doi.org/10.2172/15000424· OSTI ID:15000424

Britt, J

This report describes the marked improvements made of the production line under the PVMaT program: successfully developed a high-speed, all-laser, monolithic integration process for CIGS-based modules on polyimide substrates; exceeded PVMaT goals for scribing rate and total interconnect width; developed robust, well-controlled techniques for selective scribing; improved CIGS evaporation sources to allow uniform, controllable delivery; completed foundation required to integrate higher CIGS deposition rates into the production line; developed well-controlled Se delivery system to minimize Se consumption; successfully integrated the parallel-detector spectroscope ellipsometer (PDSE) into a production CIGS deposition chamber; collected useful, in-situ data with PDSE; validated the performance of the X-ray fluorescometry (XRF) sensor in the production CIGS deposition chamber; and successfully incorporated the XRF sensor into the control architecture of the production CIGS deposition chamber .

• Research Organization: National Renewable Energy Lab., Golden, CO. (US)
• Sponsoring Organization: US Department of Energy (US)
• DOE Contract Number: AC36-99GO10337
• OSTI ID: 15000424
• Report Number(s): NREL/SR-520-32072; ZAX-8-17647-11
• Country of Publication: United States
• Language: English

Related Subjects

14 SOLAR ENERGY
36 MATERIALS SCIENCE
ARCHITECTURE
BAND GAP
CIGS
DEPOSITION
EFFUSION SOURCE
ELLIPSOMETERS
EVAPORATION
HIGH-RATE DEPOSITION
LASER SCRIBING PROCESS
MANUFACTURING
PERFORMANCE
PRODUCTION
PV
PVMAT
REAL-TIME PROCESSING PARALLEL DETECTOR SPECTROSCOPIC ELLIPSOMETER (PDSE)
SOLAR ENERGY - PHOTOVOLTAICS
SUBSTRATES
THIN FILMS
X-RAY FLUORESCOMETRY (XRF)