Image-plate sensitivity to x rays at 2 to 60 keV
Journal Article
·
· Review of Scientific Instruments
- Univ. of Rochester, Rochester, NY (United States). Lab. for Laser Energetics; Laboratory for Laser Energetics, University of Rochester
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Univ. of Rochester, Rochester, NY (United States). Lab. for Laser Energetics
- Mission Support and Test Services, LLC, Livermore, CA (United States)
- California Polytechnic State Univ., San Luis Obispo, CA (United States)
The sensitivity of Fuji SR and MS image plates (IPs) used in x-ray spectrometers on OMEGA and the National Ignition Facility has been measured using two techniques. A set of radioisotopes has been used to constrain image-plate sensitivity between 6 and 60 keV, while a Manson source has been used to expose image plates to x rays at energies between 1.5 and 8 keV. These data have shown variation in sensitivity on the order of 5% for a given IP type and scanner settings. The radioisotope technique has also been used to assess IP fading properties for MS-type plates over long times. IP sensitivity as a function of scanner settings and pixel size has been systematically examined, showing variations of up to a factor of 2 depending on IP type. Furthermore cross-calibration of IP scanners at different facilities is necessary to produce a consistent absolute sensitivity curve spanning the energy range of 2 to 60 keV.
- Research Organization:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States); Univ. of Rochester, Rochester, NY (United States). Lab. for Laser Energetics
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- Contributing Organization:
- Laboratory for Laser Energetics, University of Rochester
- Grant/Contract Number:
- AC52-07NA27344; NA0001944
- OSTI ID:
- 1497010
- Alternate ID(s):
- OSTI ID: 1822593
- Report Number(s):
- 2018-158, 1467; LLNL-JRNL--773902; 2018-158, 1467, 2426
- Journal Information:
- Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 1 Vol. 90; ISSN 0034-6748
- Publisher:
- American Institute of Physics (AIP)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
Erratum: “Image-plate sensitivity to x rays at 2 to 60 keV” [Rev. Sci. Instrum. 90, 013506 (2019)]
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journal | February 2019 |
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