Coupled electronic and atomic effects on defect evolution in silicon carbide under ion irradiation
Journal Article
·
· Current Opinion in Solid State and Materials Science
- Sponsoring Organization:
- USDOE
- Grant/Contract Number:
- AC05-00OR22725
- OSTI ID:
- 1496386
- Journal Information:
- Current Opinion in Solid State and Materials Science, Journal Name: Current Opinion in Solid State and Materials Science Vol. 21 Journal Issue: 6; ISSN 1359-0286
- Publisher:
- ElsevierCopyright Statement
- Country of Publication:
- United Kingdom
- Language:
- English
Cited by: 41 works
Citation information provided by
Web of Science
Web of Science
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