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Title: Multivariate analysis of x-ray scattering using a stochastic source

Abstract

The normalization of scattered intensity by incident flux is a crucial step in analyzing data from stochastic x-ray free electron laser sources and is complicated by non-linearities traditionally attributed to detector saturation. Here we show that such non-linearities can also arise when the sample spectra are non-uniform within the monochromator bandwidth. A method for modeling and removing this non-linearity using multivariate regression with shot-by-shot x-ray photon energy as an independent variable is presented. In conclusion, this approach demonstrates the benefit of event building and will allow for a reconsideration of data which has proven challenging to normalize.

Authors:
 [1];  [2]
  1. SLAC National Accelerator Lab., Menlo Park, CA (United States)
  2. SLAC National Accelerator Lab., Menlo Park, CA (United States); Stanford Univ., Stanford, CA (United States)
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1493444
Alternate Identifier(s):
OSTI ID: 1489417
Grant/Contract Number:  
AC02-76SF00515; contract DE-AC02-76SF00515
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Optics Letters
Additional Journal Information:
Journal Volume: 44; Journal Issue: 2; Journal ID: ISSN 0146-9592
Publisher:
Optical Society of America (OSA)
Country of Publication:
United States
Language:
English
Subject:
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS

Citation Formats

Zohar, Sioan, and Turner, Joshua J. Multivariate analysis of x-ray scattering using a stochastic source. United States: N. p., 2019. Web. doi:10.1364/ol.44.000243.
Zohar, Sioan, & Turner, Joshua J. Multivariate analysis of x-ray scattering using a stochastic source. United States. doi:10.1364/ol.44.000243.
Zohar, Sioan, and Turner, Joshua J. Fri . "Multivariate analysis of x-ray scattering using a stochastic source". United States. doi:10.1364/ol.44.000243. https://www.osti.gov/servlets/purl/1493444.
@article{osti_1493444,
title = {Multivariate analysis of x-ray scattering using a stochastic source},
author = {Zohar, Sioan and Turner, Joshua J.},
abstractNote = {The normalization of scattered intensity by incident flux is a crucial step in analyzing data from stochastic x-ray free electron laser sources and is complicated by non-linearities traditionally attributed to detector saturation. Here we show that such non-linearities can also arise when the sample spectra are non-uniform within the monochromator bandwidth. A method for modeling and removing this non-linearity using multivariate regression with shot-by-shot x-ray photon energy as an independent variable is presented. In conclusion, this approach demonstrates the benefit of event building and will allow for a reconsideration of data which has proven challenging to normalize.},
doi = {10.1364/ol.44.000243},
journal = {Optics Letters},
issn = {0146-9592},
number = 2,
volume = 44,
place = {United States},
year = {2019},
month = {1}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record

Figures / Tables:

Figure 1 Figure 1: X-rays with 70 fs pulse widths and 120 Hz repetition rates are generated by electrons accelerated into the FEL undulator via a SASE process. The x-ray photon energy, E, is estimated using a combination of calibrated electron BPMs and position-energy dispersion curves [19). The x-ray intensity, I1, exitingmore » the undulator is measured using the FEE gas detector. The variable line-spacing monochromator [20), together with the slits downstream from the monochromator, reduces the x-ray bandwidth from -10 to 2.25 eV centered at E0 • The x-ray intensity downstream from these slits, I0, is measured using the GMD [11,12]. X-ray scattering is measured in the end-station using an APD. Steering, focusing, and other optics and diagnostics are omitted for clarity.« less

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Figures/Tables have been extracted from DOE-funded journal article accepted manuscripts.