Antisolvent processing of lead halide perovskite thin films studied by in situ X-ray diffraction

Bruening, Karsten; Tassone, Christopher J.

doi:10.1039/c8ta06025h

Antisolvent processing of lead halide perovskite thin films studied by in situ X-ray diffraction

Journal Article · Tue Sep 25 00:00:00 UTC 2018 · Journal of Materials Chemistry. A

DOI:https://doi.org/10.1039/c8ta06025h· OSTI ID:1490882

^[1]; Tassone, Christopher J. ^[1]

SLAC National Accelerator Lab., Menlo Park, CA (United States)

Here, whe conversion mechanism from the precursor ink to the perovskite film using antisolvent-induced crystallization has been studied using in situ X-ray diffraction during blade coating and antisolvent deposition. We study various solvent systems forming methylammonium lead iodide perovskite. We find that it is critical to add the antisolvent before the formation of a crystalline intermediate phase. Compared to thermal crystallization, the antisolvent-induced crystallization alters the conversion route. Instead of heterogeneous nucleation and conversion through a crystalline intermediate phase, antisolvent-assisted annealing leads to a rapid direct crystallization, resulting in highly regular smooth films.

View Accepted Manuscript (DOE)

Research Organization:: SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC02-76SF00515

OSTI ID:: 1490882

Alternate ID(s):: OSTI ID: 1474756
OSTI ID: 1491404

Journal Information:: Journal of Materials Chemistry. A, Journal Name: Journal of Materials Chemistry. A Journal Issue: 39 Vol. 6; ISSN JMCAET; ISSN 2050-7488

Publisher:: Royal Society of ChemistryCopyright Statement

Country of Publication:: United States

Language:: English

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