Microstructure Analysis of Bismuth Absorbers for Transition-Edge Sensor X-ray Microcalorimeters

Yan, Daikang; Divan, Ralu; Gades, Lisa M.; Kenesei, Peter; Madden, Timothy J.; Miceli, Antonino; Park, Jun -Sang; Patel, Umeshkumar M.; Quaranta, Orlando; Sharma, Hemant; Bennett, Douglas A.; Doriese, William B.; Fowler, Joseph W.; Gard, Johnathon D.; Hays-Wehle, James P.; Morgan, Kelsey M.; Schmidt, Daniel R.; Swetz, Daniel S.; Ullom, Joel N.

doi:10.1007/s10909-018-1888-1

Microstructure Analysis of Bismuth Absorbers for Transition-Edge Sensor X-ray Microcalorimeters

Journal Article · Mon Mar 19 00:00:00 EDT 2018 · Journal of Low Temperature Physics

DOI:https://doi.org/10.1007/s10909-018-1888-1· OSTI ID:1487025

Yan, Daikang ^[1]; Divan, Ralu ^[2]; Gades, Lisa M. ^[2]; Kenesei, Peter ^[2]; Madden, Timothy J. ^[2]; Miceli, Antonino ^[2]; Park, Jun -Sang ^[2]; Patel, Umeshkumar M. ^[2]; Quaranta, Orlando ^[1]; Sharma, Hemant ^[2]; Bennett, Douglas A. ^[3]; Doriese, William B. ^[3]; Fowler, Joseph W. ^[3]; Gard, Johnathon D. ^[4]; Hays-Wehle, James P. ^[3]; Morgan, Kelsey M. ^[4]; Schmidt, Daniel R. ^[3]; Swetz, Daniel S. ^[3]; Ullom, Joel N. ^[4]

Argonne National Lab. (ANL), Argonne, IL (United States); Northwestern Univ., Evanston, IL (United States)
Argonne National Lab. (ANL), Argonne, IL (United States)
National Inst. of Standards and Technology (NIST), Boulder, CO (United States)
National Inst. of Standards and Technology (NIST), Boulder, CO (United States); Univ. of Colorado, Boulder, CO (United States)

Given its large X-ray stopping power and low specific heat capacity, bismuth (Bi) is a promising absorber material for X-ray microcalorimeters and has been used with transition-edge sensors (TESs) in the past. However, distinct X-ray spectral features have been observed in TESs with Bi absorbers deposited with different techniques. Evaporated Bi absorbers are widely reported to have non-Gaussian low-energy tails, while electroplated ones do not show this feature. In this study, we fabricated Bi absorbers with these two methods and performed microstructure analysis using scanning electron microscopy and X-ray diffraction microscopy. The two types of material showed the same crystallographic structure, but the grain size of the electroplated Bi was about 40 times larger than that of the evaporated Bi. Furthermore, this distinction in grain size is likely to be the cause of their different spectral responses.

View Accepted Manuscript (DOE)

Research Organization:: Argonne National Lab. (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Scientific User Facilities Division

Grant/Contract Number:: AC02-06CH11357

OSTI ID:: 1487025

Alternate ID(s):: OSTI ID: 22809877

Journal Information:: Journal of Low Temperature Physics, Journal Name: Journal of Low Temperature Physics Journal Issue: 3-4 Vol. 193; ISSN 0022-2291

Publisher:: Plenum PressCopyright Statement

Country of Publication:: United States

Language:: English

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