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From narrow gap to ultra-wide band gap systems: End of band gap problem excuses for defect calculations.

Conference · Fri Dec 01 04:00:00 EST 2017

OSTI ID:1485048

Schultz, Peter Andrew; Edwards, Arthur H. ^[1]; Van Ginhoven, Renee M. ^[1]; Pineda, Andrew C. ^[1]

AFRL

Abstract not provided.

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Research Organization:: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

DOE Contract Number:: AC04-94AL85000

OSTI ID:: 1485048

Report Number(s):: SAND2017-13128C; 659276

Country of Publication:: United States

Language:: English

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