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Detwinning through migration of twin boundaries in nanotwinned Cu films under in situ ion irradiation

Journal Article · · Science and Technology of Advanced Materials
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  1. Peking Univ., Beijing (People's Republic of China)
  2. China Univ. of Petroleum, Beijing (People's Republic of China)
  3. Xi’an Jiaotong Univ. Xi’an (People's Republic of China)
  4. Argonne National Lab. (ANL), Argonne, IL (United States)
The mechanism of radiation-induced detwinning is different from that of deformation detwinning as the former is dominated by supersaturated radiation-induced defects while the latter is usually triggered by global stress. In situ Kr ion irradiation was performed to study the detwinning mechanism of nanotwinned Cu films with various twin thicknesses. Two types of incoherent twin boundaries (ITBs), so-called fixed ITBs and free ITBs, are characterized based on their structural features, and the difference in their migration behavior is investigated. It is observed that detwinning during radiation is attributed to the frequent migration of free ITBs, while the migration of fixed ITBs is absent. Statistics shows that the migration distance of free ITBs is thickness and dose dependent. Here, potential migration mechanisms are discussed.
Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Organization:
China University of Petroleum; Ministry of Science and Technology of the People's Republic of China; National Natural Science Foundation of China (NSFC); USDOE
Grant/Contract Number:
AC02-06CH11357
OSTI ID:
1483413
Journal Information:
Science and Technology of Advanced Materials, Journal Name: Science and Technology of Advanced Materials Journal Issue: 1 Vol. 19; ISSN 1468-6996
Publisher:
IOP PublishingCopyright Statement
Country of Publication:
United States
Language:
English

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