Use of coherent X-ray diffraction to map strain fields in nanocrystals
Journal Article
·
· Applied Surface Science
Abstract not provided
- Research Organization:
- Advanced Photon Source (APS), Argonne National Laboratory (ANL), Argonne, IL (US)
- Sponsoring Organization:
- DOE - BIOLOGICAL AND ENVIRONMENTAL RESEARCH
- OSTI ID:
- 1477048
- Journal Information:
- Applied Surface Science, Journal Name: Applied Surface Science Journal Issue: 3-4 Vol. 182; ISSN 0169-4332
- Publisher:
- Elsevier
- Country of Publication:
- United States
- Language:
- ENGLISH
Similar Records
Full strain tensor measurements with X-ray diffraction and strain field mapping: a simulation study
Enhancement of coherent X-ray diffraction from nanocrystals by introduction of X-ray optics
Coherent diffraction patterns of individual dislocation strain fields
Journal Article
·
Fri May 22 00:00:00 EDT 2020
· J. Synchrotron Rad.
·
OSTI ID:1630340
Enhancement of coherent X-ray diffraction from nanocrystals by introduction of X-ray optics
Journal Article
·
Tue Dec 31 23:00:00 EST 2002
· Optics Express
·
OSTI ID:1477047
Coherent diffraction patterns of individual dislocation strain fields
Journal Article
·
Tue Jul 20 00:00:00 EDT 2010
· J. Phys. D
·
OSTI ID:1008524