Zeeman spectroscopy as a method for determining the magnetic field distribution in self-magnetic-pinch diodes (invited)

Journal Article · Mon Oct 08 00:00:00 EDT 2018 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.5039386· OSTI ID:1476684

Patel, S. G.; Johnston, M. D.; Webb, T. J.; Bennett, N. L.; Welch, D. R.; Gilgenbach, R. M.; Cuneo, M. E.; Kiefer, M. L.; Leckbee, J. J.; Mazarakis, M. G.; Muron, D. J.; Renk, T. J.; Simpson, S. C.; Doron, R.; Biswas, S.; Mikitchuk, D.; Maron, Y.

In the self-magnetic-pinch diode, the electron beam, produced through explosive field emission, focuses on the anode surface due to its own magnetic field. This process results in dense plasma formation on the anode surface, consisting primarily of hydrocarbons. Direct measurements of the beam’s current profile are necessary in order to understand the pinch dynamics and to determine x-ray source sizes, which should be minimized in radiographic applications. In this paper, the analysis of the C IV doublet (580.1 and 581.2 nm) line shapes will be discussed. The technique yields estimates of the electron density and electron temperature profiles, and the method can be highly beneficial in providing the current density distribution in such diodes.

• Sponsoring Organization: USDOE
• Grant/Contract Number: NA0003525
• OSTI ID: 1476684
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 10 Vol. 89; ISSN 0034-6748
• Publisher: American Institute of Physics
• Country of Publication: United States
• Language: English