Orientation mapping of semicrystalline polymers using scanning electron nanobeam diffraction

Panova, Ouliana; Chen, X. Chelsea; Bustillo, Karen C.; Ophus, Colin; Bhatt, Mahesh P.; Balsara, Nitash; Minor, Andrew M.

doi:10.1016/j.micron.2016.05.008

Title: Orientation mapping of semicrystalline polymers using scanning electron nanobeam diffraction

Journal Article · Fri May 27 00:00:00 EDT 2016 · Micron

DOI:https://doi.org/10.1016/j.micron.2016.05.008· OSTI ID:1474961

Panova, Ouliana ^[1]; Chen, X. Chelsea ^[2]; Bustillo, Karen C. ^[3]; Ophus, Colin ^[3]; Bhatt, Mahesh P. ^[4]; Balsara, Nitash ^[5]; Minor, Andrew M. ^[1]

University of California, Berkeley, CA (United States); Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States). National Center for Electron Microscopy
University of California, Berkeley, CA (United States); Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States). National Center for Electron Microscopy
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
University of California, Berkeley, CA (United States); Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States). Materials Sciences Division and Joint Center for Energy Storage Research (JCESR)

Here, we demonstrate a scanning electron nanobeam diffraction technique that can be used for mapping the size and distribution of nanoscale crystalline regions in a polymer blend. In addition, it can map the relative orientation of crystallites and the degree of crystallinity of the material. The model polymer blend is a 50:50 w/w mixture of semicrystalline poly(3-hexylthiophene-2,5-diyl) (P3HT) and amorphous polystyrene (PS). The technique uses a scanning electron beam to raster across the sample and acquires a diffraction image at each probe position. Through image alignment and filtering, the diffraction image dataset enables mapping of the crystalline regions within the scanned area and construction of an orientation map.

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Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division; USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division

Grant/Contract Number:: AC02-05CH11231

OSTI ID:: 1474961

Alternate ID(s):: OSTI ID: 1351660

Journal Information:: Micron, Vol. 88, Issue C; Related Information: © 2016 Elsevier Ltd.; ISSN 0968-4328

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 43 works

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36 MATERIALS SCIENCE
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Title: Orientation mapping of semicrystalline polymers using scanning electron nanobeam diffraction

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