X-pinch X-ray emission on a portable low-current, fast rise-time generator

Shelkovenko, T. A.; Pikuz, S. A.; Tilikin, I. N.; Bland, S. N.; Lall, D.; Chaturvedi, N.; Georgakis, A.

doi:10.1063/1.5032112

Title: X-pinch X-ray emission on a portable low-current, fast rise-time generator

Journal Article · Fri Aug 31 00:00:00 EDT 2018 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.5032112· OSTI ID:1468395

Shelkovenko, T. A. ^[1];

^[1]; Tilikin, I. N. ^[2];

^[3]; Lall, D. ^[3]; Chaturvedi, N. ^[3]; Georgakis, A. ^[3]

Cornell Univ., Ithaca, NY (United States); P. N. Lebedev Inst., Moscow (Russian Federation)
P. N. Lebedev Inst., Moscow (Russian Federation)
Imperial College, London (United Kingdom). Blackett Lab.

In this paper, we report on experiments exploring X-ray emission from an X-pinch driven by a small Marx-waterline generator supplying 50 kA with a risetime of 50 ns and a peak voltage of ~250 kV. Both standard crossed wire loads and hybrid loads utilizing conical metal electrodes with a single short wire in between them were studied, and in both cases reliable modes of operation were obtained for X-ray radiography. Soft (few keV) and Hard (>5 keV) X-ray emission characteristics were observed. With standard X-pinches, soft radiation emanated from a small hot spot about 3 μm in size, along with hard radiation from a ~200 μm region close to this hot spot. With hybrid X-pinches, the hot spot was <7 μm in size. Finally, there was a clear correlation between the soft and hard X-ray emission—pinches that produced intense soft X-ray emission from a small hot spot also produced the most intense, localized hard X-ray emission.

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Research Organization:: Cornell Univ., Ithaca, NY (United States); Imperial College, London (United Kingdom)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA); First Light Fusion (United Kingdom); AWE Aldermaston plc (United Kingdom)

Grant/Contract Number:: NA0003764

OSTI ID:: 1468395

Alternate ID(s):: OSTI ID: 1467946

Journal Information:: Journal of Applied Physics, Vol. 124, Issue 8; ISSN 0021-8979

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 11 works

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References (29)

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