Nano-crystallization induced by high-energy heavy ion irradiation in UO₂

Journal Article · Thu May 03 00:00:00 EDT 2018 · Scripta Materialia

DOI:https://doi.org/10.1016/j.scriptamat.2018.04.006· OSTI ID:1467638

Miao, Yinbin ^[1]; Yao, Tiankai ^[2]; Lian, Jie ^[2]; Zhu, Shaofei ^[1]; Bhattacharya, Sumit ^[1]; Oaks, Aaron ^[1]; Yacout, Abdellatif M. ^[1]; Mo, Kun ^[1]

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1. Argonne National Lab. (ANL), Lemont, IL (United States)
2. Rensselaer Polytechnic Inst., Troy, NY (United States)

Here, advanced microstructure investigations of the high-burnup structure (HBS) in UO₂ produced by high-dose 84 MeV Xe ion irradiation are reported. Spark plasma sintered micro-grained UO₂ was irradiated to 1357 dpa at 350 degrees C. The characteristic nano-grains and micro-pores of the HBS were formed. The grain size and grain boundary misorientation distributions of the HBS were measured using transmission electron microscopy based orientation imaging microscopy. Grain polygonization due to accumulation of radiation-induced dislocations was found to be the mechanism of nano-crystallization. The morphology of Xe bubbles was quantitatively investigated. Finally, this study provides crucial references for advanced fuel performance modeling of high-burnup UO₂.

• Research Organization: Argonne National Laboratory (ANL), Argonne, IL (United States)
• Sponsoring Organization: USDOE Office of Nuclear Energy (NE); USDOE Office of Nuclear Energy (NE). Nuclear Energy Advanced Modeling and Simulation (NEAMS); USDOE Office of Science (SC), Nuclear Physics (NP) (SC-26)
• Grant/Contract Number: AC02-06CH11357; NE0008564
• OSTI ID: 1467638
• Alternate ID(s): OSTI ID: 22813105; OSTI ID: 1496403
• Journal Information: Scripta Materialia, Journal Name: Scripta Materialia Journal Issue: C Vol. 155; ISSN 1359-6462
• Publisher: Elsevier
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
High-burnup structure (HBS)
Misorientation
Nanocrystalline microstructure
Orientation imaging microscopy (OIM)
Scanning/transmission electronmicroscopy (STEM)