High Bragg reflectivity of diamond crystals exposed to multi-kW mm–2 X-ray beams
- Argonne National Lab. (ANL), Lemont, IL (United States); AGH Univ. of Science and Technology, Krakow (Poland)
- Argonne National Lab. (ANL), Lemont, IL (United States)
- Cornell Univ., Ithaca, NY (United States)
- Argonne National Lab. (ANL), Lemont, IL (United States); Washington State Univ., Lemont, IL (United States)
- Advanced Photon Source, Lemont, IL (United States)
- Technological Institute for Superhard and Novel Carbon Materials, Troitsk (Russian Federation)
X-ray free-electron lasers in the oscillator configuration (XFELO) are future fully coherent hard X-rays sources with ultrahigh spectral purity. X-ray beams circulate in an XFELO optical cavity comprising diamond single crystals. They function as high-reflectance (close to 100%), narrowband (~10 meV) Bragg backscattering mirrors. The average power density of the X-ray beams in the XFELO cavity is predicted to be as high as ~10 kW mm–2. Therefore, XFELO feasibility relies on the ability of diamond crystals to withstand such a high radiation load and preserve their high reflectivity. Here the endurance of diamond crystals to irradiation with multi-kW mm–2 power density X-ray beams is studied. It is shown that the high Bragg reflectivity of the diamond crystals is preserved after the irradiation, provided it is performed at ~1 × 10–8 Torr high-vacuum conditions. In conclusion, irradiation under 4 × 10–6 Torr results in a ~1 meV shift of the Bragg peak, which corresponds to a relative lattice distortion of 4 × 10–8, while the high Bragg reflectivity stays intact.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
- Grant/Contract Number:
- AC02-06CH11357
- OSTI ID:
- 1465532
- Journal Information:
- Journal of Synchrotron Radiation (Online), Journal Name: Journal of Synchrotron Radiation (Online) Journal Issue: 4 Vol. 25; ISSN 1600-5775; ISSN JSYRES
- Publisher:
- International Union of CrystallographyCopyright Statement
- Country of Publication:
- United States
- Language:
- English
 
                                                 
                                                 
                                                 
                                                 
                                                 
                                                