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Title: Dual-pass upgrade to the Thomson scattering diagnostic on the Prototype-Material Plasma Exposure eXperiment (Proto-MPEX)

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.5039370· OSTI ID:1464859

The Thomson scattering (TS) diagnostic on the Prototype-Material Plasma Exposure eXperiment has been upgraded to measure electron temperature (Te) and density (ne) simultaneously at two axial locations. After the first pass through the vacuum vessel, the exiting laser beamline is re-collimated in the atmosphere and rerouted into the vacuum vessel for the second pass. The upgrade will help diagnose axial Te and ne gradients between the “central chamber” and the target region which are located 1 m and 2.5 m, respectively, downstream from the Helicon radio-frequency source. The TS measurements have given Te ≈ 4–15 eV and ne ≈ 2–4 × 1019 m−3 at the central chamber and Te ≈ 1–2 eV and ne ≈ 1–2 × 1019 m−3 at the target region. The upgrade also increases the number of sampling points at the target region from 3 fibers to 5 fibers, measuring 3 cm radially across the plasma column, and 25 fibers in the central chamber, radially spanning 8 cm. The intensified CCD camera is double triggered for each laser pulse in order to measure (1) the TS and laser stray light and (2) the plasma background light that contains nuisance emission lines and bremsstrahlung. Subtracting the background light from the TS photons improves the temperature and density measurements. Details of the diagnostic setup, axial and radial measurements, and areas for further optimization are discussed.

Sponsoring Organization:
USDOE
Grant/Contract Number:
AC05-00OR22725
OSTI ID:
1464859
Journal Information:
Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Vol. 89 Journal Issue: 10; ISSN 0034-6748
Publisher:
American Institute of PhysicsCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 3 works
Citation information provided by
Web of Science

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